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JIANXIN WU
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SAN JOSE, CA, US
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last 30 patents
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Patent Grant
Apparatus for detecting a sample
Patent number
8,089,637
Issue date
Jan 3, 2012
Hermes-Microvision, Inc.
You-Jin Wang
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
APPARATUS FOR DETECTING A SAMPLE
Publication number
20100165346
Publication date
Jul 1, 2010
Hermes-Microvision, Inc.
YOU-JIN WANG
G01 - MEASURING TESTING