Jianxin Zhang

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Santa Clara, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Computer-implemented methods and systems for classifying defects on...
- Patent number 8,532,949
- Issue date Sep 10, 2013
- KLA-Tencor Technologies Corp.
- Cho Huak Teh
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for determining a defect criticality index for...
- Patent number 8,139,844
- Issue date Mar 20, 2012
- KLA-Tencor Corp.
- Chien-Huei (Adam) Chen
- G01 - MEASURING TESTING
Information Patent Grant
Automatic supervised classifier setup tool for semiconductor defects
- Patent number 7,359,544
- Issue date Apr 15, 2008
- KLA-Tencor Technologies Corporation
- Lisheng Gao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Flexible hybrid defect classification for semiconductor manufacturing
- Patent number 7,142,992
- Issue date Nov 28, 2006
- KLA-Tencor Technologies Corp.
- Patrick Huet
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND SYSTEMS FOR DETERMINING A DEFECT CRITICALITY INDEX FOR...
- Publication number 20090257645
- Publication date Oct 15, 2009
- Chien-Huei (Adam) Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FLEXIBLE HYBRID DEFECT CLASSIFICATION FOR SEMICONDUCTOR MANUFACTURING
- Publication number 20060265145
- Publication date Nov 23, 2006
- Patrick Huet
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Computer-implemented methods and systems for classifying defects on...
- Publication number 20060082763
- Publication date Apr 20, 2006
- Cho Huak Teh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Automatic supervised classifier setup tool for semiconductor defects
- Publication number 20040156540
- Publication date Aug 12, 2004
- KLA-Tencor Technologies, Corporation
- Lisheng Gao
- G06 - COMPUTING CALCULATING COUNTING