Jiaqi Yang

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Beijing, CN

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Patents Grantslast 30 patents

Information Patent Grant
Method of testing reliability of semiconductor device
- Patent number 8,552,754
- Issue date Oct 8, 2013
- Peking University
- Xiaoyan Liu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF TESTING RELIABILITY OF SEMICONDUCTOR DEVICE
- Publication number 20120299608
- Publication date Nov 29, 2012
- Peking University
- Xiaoyan Liu
- G01 - MEASURING TESTING