Jiarui Dong

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Beijing, CN

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Patents Grantslast 30 patents

Information Patent Grant
Method and device for detecting and evaluating defect
- Patent number 11,099,156
- Issue date Aug 24, 2021
- Tsinghua University
- Songling Huang
- G01 - MEASURING TESTING
Information Patent Grant
Method for reconstructing defect
- Patent number 10,935,520
- Issue date Mar 2, 2021
- Tsinghua University
- Songling Huang
- G01 - MEASURING TESTING
Information Patent Grant
Imaging method and device based on guided wave scattering of omni-d...
- Patent number 10,338,035
- Issue date Jul 2, 2019
- NANCHANG HANGKONG UNIVERSITY
- Songling Huang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND DEVICE FOR DETECTING AND EVALUATING DEFECT
- Publication number 20200003729
- Publication date Jan 2, 2020
- TSINGHUA UNIVERSITY
- Songling HUANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR RECONSTRUCTING DEFECT
- Publication number 20180275099
- Publication date Sep 27, 2018
- TSINGHUA UNIVERSITY
- Songling HUANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGING METHOD AND DEVICE BASED ON GUIDED WAVE SCATTERING OF OMNI-D...
- Publication number 20180231503
- Publication date Aug 16, 2018
- NANCHANG HANGKONG UNIVERSITY
- Songling Huang
- G01 - MEASURING TESTING