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Jiayao Zhang
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Sunnyvale, CA, US
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Patents Grants
last 30 patents
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Patent Grant
Bright-field differential interference contrast system with scannin...
Patent number
9,052,190
Issue date
Jun 9, 2015
KLA-Tencor Corporation
Ali Salehpour
G01 - MEASURING TESTING
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Patent Grant
Large particle detection for multi-spot surface scanning inspection...
Patent number
8,755,044
Issue date
Jun 17, 2014
KLA-Tencor Corporation
Juergen Reich
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Enhanced Inspection and Metrology Techniques And Systems Using Brig...
Publication number
20140268172
Publication date
Sep 18, 2014
Ali Salehpour
G01 - MEASURING TESTING
Information
Patent Application
Large Particle Detection For Multi-Spot Surface Scanning Inspection...
Publication number
20130050689
Publication date
Feb 28, 2013
KLA-Tencor Corporation
Juergen Reich
G01 - MEASURING TESTING