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Jie Dong
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Tokyo, JP
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last 30 patents
Information
Patent Grant
Spectroscopic method for analyzing isotopes by using a semiconducto...
Patent number
6,800,855
Issue date
Oct 5, 2004
Nippon Sanso Corporation
Jie Dong
G01 - MEASURING TESTING
Information
Patent Grant
Spectroscopic method for analyzing a gas by using laser beam
Patent number
6,636,316
Issue date
Oct 21, 2003
Nippon Sanso Corporation
Koh Matsumoto
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for measuring light absorption spectra
Patent number
6,434,496
Issue date
Aug 13, 2002
Nippon Sanso Corporation
Jie Dong
G01 - MEASURING TESTING