Jie Han

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Shanghai, CN

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Patents Grantslast 30 patents

Information Patent Grant
Light modulation for inspection probes
- Patent number 11,125,551
- Issue date Sep 21, 2021
- Baker Hughes, a GE company, LLC
- Zirong Zahi
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device and method thereof
- Patent number 9,188,543
- Issue date Nov 17, 2015
- General Electric Company
- Tao Li
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION ASSISTANT FOR AIDING VISUAL INSPECTIONS OF MACHINES
- Publication number 20220236197
- Publication date Jul 28, 2022
- GENERAL ELECTRIC COMPANY
- Peng Wang
- G08 - SIGNALLING
Information Patent Application
Probe System and Method
- Publication number 20180045510
- Publication date Feb 15, 2018
- GENERAL ELECTRIC COMPANY
- Zirong Zahi
- G02 - OPTICS
Information Patent Application
BORESCOPE AND NAVIGATION METHOD THEREOF
- Publication number 20150319410
- Publication date Nov 5, 2015
- GENERAL ELECTRIC COMPANY
- Jiajun GU
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
INSPECTION DEVICE AND METHOD THEREOF
- Publication number 20130271763
- Publication date Oct 17, 2013
- Tao Li
- G02 - OPTICS