Jie Lai

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Belle Mead, NJ, US

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Patents Grantslast 30 patents

Information Patent Grant
Estimating angle measurements for source tracking using a phased ar...
- Patent number 11,397,256
- Issue date Jul 26, 2022
- Cypress Semiconductor Corporation
- Ashutosh Pandey
- G01 - MEASURING TESTING
Information Patent Grant
Estimating angle measurements for source tracking using a phased ar...
- Patent number 10,746,864
- Issue date Aug 18, 2020
- Cypress Semiconductor Corporation
- Ashutosh Pandey
- G01 - MEASURING TESTING
Information Patent Grant
Estimating angle measurements for source tracking using a phased ar...
- Patent number 9,989,633
- Issue date Jun 5, 2018
- Cypress Semiconductor Corporation
- Ashutosh Pandey
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ESTIMATING ANGLE MEASUREMENTS FOR SOURCE TRACKING USING A PHASED AR...
- Publication number 20210041552
- Publication date Feb 11, 2021
- CYPRESS SEMICONDUCTOR CORPORATION
- Ashutosh Pandey
- G01 - MEASURING TESTING
Information Patent Application
ESTIMATING ANGLE MEASUREMENTS FOR SOURCE TRACKING USING A PHASED AR...
- Publication number 20180348357
- Publication date Dec 6, 2018
- CYPRESS SEMICONDUCTOR CORPORATION
- Ashutosh Pandey
- G01 - MEASURING TESTING