Jie Lin

Person

Santa Clara, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for detecting calibration requirement for imag...
- Patent number 11,967,112
- Issue date Apr 23, 2024
- AitronX Inc.
- Xinlu Tang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Circuit for detecting low-power optical data signal
- Patent number 11,740,406
- Issue date Aug 29, 2023
- MARVELL ASIA PTE. LTD.
- Jie Lin
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Silicon optical modulator, method for making the same
- Patent number 11,686,991
- Issue date Jun 27, 2023
- MARVELL ASIA PTE. LTD.
- Xiaoguang Tu
- G02 - OPTICS
Information Patent Grant
TE polarizer based on SOI platform
- Patent number 11,662,521
- Issue date May 30, 2023
- MARVELL ASIA PTE. LTD.
- Jie Lin
- G02 - OPTICS
Information Patent Grant
Temperature insensitive distributed strain monitoring apparatus and...
- Patent number 11,644,305
- Issue date May 9, 2023
- MARVELL ASIA PTE. LTD.
- Chunshu Zhang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Wide-band multimode interference coupler with arbitrary power split...
- Patent number 11,624,873
- Issue date Apr 11, 2023
- MARVELL ASIA PTE. LTD.
- Hong Cai
- G02 - OPTICS
Information Patent Grant
Method for detecting low-power optical signal with high sensitivity
- Patent number 11,460,634
- Issue date Oct 4, 2022
- MARVELL ASIA PTE. LTD.
- Jie Lin
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Colorless splitter based on SOI platform
- Patent number 11,385,407
- Issue date Jul 12, 2022
- MARVELL ASIA PTE. LTD.
- Jie Lin
- G02 - OPTICS
Information Patent Grant
Silicon-based polarization beam splitter
- Patent number 11,333,830
- Issue date May 17, 2022
- MARVELL ASIA PTE. LTD.
- Jie Lin
- G02 - OPTICS
Information Patent Grant
TE polarizer based on SOI platform
- Patent number 11,099,327
- Issue date Aug 24, 2021
- Inphi Corporation
- Jie Lin
- G02 - OPTICS
Information Patent Grant
Silicon optical modulator, method for making the same
- Patent number 11,086,189
- Issue date Aug 10, 2021
- Inphi Corporation
- Xiaoguang Tu
- G02 - OPTICS
Information Patent Grant
Method and system for identifying defects of integrated circuits
- Patent number 10,628,935
- Issue date Apr 21, 2020
- Zhongke Jingyuan Electron Limited
- Zhaoli Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
TE polarizer based on SOI platform
- Patent number 10,627,574
- Issue date Apr 21, 2020
- Inphi Corporation
- Jie Lin
- G02 - OPTICS
Information Patent Grant
Mask pattern generation based on fast marching method
- Patent number 10,578,963
- Issue date Mar 3, 2020
- ASML US, LLC
- Yuan He
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Dynamic updates for the inspection of integrated circuits
- Patent number 10,565,702
- Issue date Feb 18, 2020
- Dongfang Jingyuan Electron Limited
- Zhaoli Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Care area generation for inspecting integrated circuits
- Patent number 10,515,444
- Issue date Dec 24, 2019
- Dongfang Jingyuan Electron Limited
- Jie Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
TE polarizer based on SOI platform
- Patent number 10,310,185
- Issue date Jun 4, 2019
- Inphi Corporation
- Jie Lin
- G02 - OPTICS
Information Patent Grant
Integrated photo detector, method of making the same
- Patent number 10,262,983
- Issue date Apr 16, 2019
- Inphi Corporation
- Jie Lin
- G02 - OPTICS
Information Patent Grant
Method and system for defect prediction of integrated circuits
- Patent number 10,140,400
- Issue date Nov 27, 2018
- Dongfang Jingyuan Electron Limited
- Zongchang Yu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Guided defect detection of integrated circuits
- Patent number 10,133,838
- Issue date Nov 20, 2018
- Dongfang Jingyuan Electron Limited
- Hua-Yu Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Silicon-waveguide-based broadband polarization beam rotator
- Patent number 10,133,002
- Issue date Nov 20, 2018
- Inphi Corporation
- Jie Lin
- G02 - OPTICS
Information Patent Grant
Silicon-based multiplexer/demultiplexer
- Patent number 10,126,507
- Issue date Nov 13, 2018
- Inphi Corporation
- Jie Lin
- G02 - OPTICS
Information Patent Grant
Silicon-waveguide-based broadband polarization splitter-rotator
- Patent number 10,101,532
- Issue date Oct 16, 2018
- Inphi Corporation
- Jie Lin
- G02 - OPTICS
Information Patent Grant
Silicon-based multiplexer/demultiplexer for O-band
- Patent number 10,036,853
- Issue date Jul 31, 2018
- Inphi Corporation
- Jie Lin
- G02 - OPTICS
Information Patent Grant
Integrated photo detector, method of making the same
- Patent number 9,997,508
- Issue date Jun 12, 2018
- Inphi Corporation
- Jie Lin
- G02 - OPTICS
Information Patent Grant
Silicon-waveguide-based broadband polarization splitter-rotator
- Patent number 9,915,781
- Issue date Mar 13, 2018
- Inphi Corporation
- Jie Lin
- G02 - OPTICS
Information Patent Grant
Silicon-waveguide-based broadband polarization beam rotator
- Patent number 9,864,141
- Issue date Jan 9, 2018
- Inphi Corporation
- Jie Lin
- G02 - OPTICS
Information Patent Grant
Broadband restricted MMI-based polarization beam splitter
- Patent number 9,851,507
- Issue date Dec 26, 2017
- Inphi Corporation
- Jie Lin
- G02 - OPTICS
Information Patent Grant
Broadband restricted MMI-based polarization beam splitter
- Patent number 9,759,865
- Issue date Sep 12, 2017
- Inphi Corporation
- Jie Lin
- G02 - OPTICS
Information Patent Grant
Method for forming a self-aligned mach-zehnder interferometer
- Patent number 9,746,744
- Issue date Aug 29, 2017
- Inphi Corporation
- Jie Lin
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
Multi-Junction Broadband Photodetector
- Publication number 20250120189
- Publication date Apr 10, 2025
- Marvell Asia Pte Ltd.
- Hamed Pishvaibazargani
Information Patent Application
Method And Apparatus For Detecting Caliberation Requirement For Ima...
- Publication number 20240078706
- Publication date Mar 7, 2024
- AitronX Inc.
- Jie Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Optical transceiver with multimode interferometers
- Publication number 20240022329
- Publication date Jan 18, 2024
- Marvell Asia Pte Ltd.
- Yun Wang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
ASYMMETRICAL SEMICONDUCTOR-BASED OPTICAL MODULATOR
- Publication number 20230314896
- Publication date Oct 5, 2023
- Marvell Asia Pte Ltd.
- Hamed PISHVAIBAZARGANI
- G02 - OPTICS
Information Patent Application
CIRCUIT FOR DETECTING LOW-POWER OPTICAL DATA SIGNAL
- Publication number 20220413215
- Publication date Dec 29, 2022
- Marvell Asia Pte Ltd.
- Jie LIN
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
TEMPERATURE INSENSITIVE DISTRIBUTED STRAIN MONITORING APPARATUS AND...
- Publication number 20220397388
- Publication date Dec 15, 2022
- Chunshu Zhang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
WIDE-BAND MULTIMODE INTERFERENCE COUPLER WITH ARBITRARY POWER SPLIT...
- Publication number 20220317372
- Publication date Oct 6, 2022
- Marvell Asia Pte, Ltd.
- Hong CAI
- G02 - OPTICS
Information Patent Application
METHOD FOR DETECTING LOW-POWER OPTICAL SIGNAL WITH HIGH SENSITIVITY
- Publication number 20220075115
- Publication date Mar 10, 2022
- INPHI CORPORATION
- Jie LIN
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
TE POLARIZER BASED ON SOI PLATFORM
- Publication number 20210364701
- Publication date Nov 25, 2021
- Marvell Asia Pte, Ltd.
- Jie LIN
- G02 - OPTICS
Information Patent Application
COLORLESS SPLITTER BASED ON SOI PLATFORM
- Publication number 20210325606
- Publication date Oct 21, 2021
- INPHI CORPORATION
- Jie LIN
- G02 - OPTICS
Information Patent Application
TE POLARIZER BASED ON SOI PLATFORM
- Publication number 20200264373
- Publication date Aug 20, 2020
- INPHI CORPORATION
- Jie LIN
- G02 - OPTICS
Information Patent Application
SILICON-BASED POLARIZATION BEAM SPLITTER
- Publication number 20200257127
- Publication date Aug 13, 2020
- INPHI CORPORATION
- Jie LIN
- G02 - OPTICS
Information Patent Application
Dose Map Optimization for Mask Making
- Publication number 20200096876
- Publication date Mar 26, 2020
- ASML US, LLC f/k/a/ ASML US, INC.
- Jie Lin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
TE POLARIZER BASED ON SOI PLATFORM
- Publication number 20200018903
- Publication date Jan 16, 2020
- INPHI CORPORATION
- Jie LIN
- G02 - OPTICS
Information Patent Application
Mask Pattern Generation Based on Fast Marching Method
- Publication number 20190324366
- Publication date Oct 24, 2019
- Xtal, Inc.
- Yuan He
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SILICON-BASED MULTIPLEXER/DEMULTIPLEXER
- Publication number 20180321443
- Publication date Nov 8, 2018
- INPHI CORPORATION
- Jie LIN
- G02 - OPTICS
Information Patent Application
SILICON-WAVEGUIDE-BASED BROADBAND POLARIZATION SPLITTER-ROTATOR
- Publication number 20180284348
- Publication date Oct 4, 2018
- INPHI CORPORATION
- Jie LIN
- G02 - OPTICS
Information Patent Application
INTEGRATED PHOTO DETECTOR, METHOD OF MAKING THE SAME
- Publication number 20180261591
- Publication date Sep 13, 2018
- INPHI CORPORATION
- Jie LIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and System for Defect Prediction of Integrated Circuits
- Publication number 20180218096
- Publication date Aug 2, 2018
- DONGFANG JINGYUAN ELECTRON LIMITED
- Zongchang Yu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Guided Defect Detection of Integrated Circuits
- Publication number 20180218090
- Publication date Aug 2, 2018
- DONGFANG JINGYUAN ELECTRON LIMITED
- Hua-Yu Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method And System For Identifying Defects Of Integrated Circuits
- Publication number 20180218492
- Publication date Aug 2, 2018
- DONGFANG JINGYUAN ELECTRON LIMITED
- Zhaoli Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Care Area Generation For Inspecting Integrated Circuits
- Publication number 20180218490
- Publication date Aug 2, 2018
- DONGFANG JINGYUAN ELECTRON LIMITED
- Jie Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Dynamic Updates for the Inspection of Integrated Circuits
- Publication number 20180218493
- Publication date Aug 2, 2018
- DONGFANG JINGYUAN ELECTRON LIMITED
- Zhaoli Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BROADBAND GENERAL INTERFERENCE MMI-BASED POLARIZATION BEAM SPLITTER
- Publication number 20180172913
- Publication date Jun 21, 2018
- INPHI CORPORATION
- Jie LIN
- G02 - OPTICS
Information Patent Application
SILICON-WAVEGUIDE-BASED BROADBAND POLARIZATION BEAM ROTATOR
- Publication number 20180164505
- Publication date Jun 14, 2018
- INPHI CORPORATION
- Jie LIN
- G02 - OPTICS
Information Patent Application
INTEGRATED PHOTO DETECTOR, METHOD OF MAKING THE SAME
- Publication number 20180019239
- Publication date Jan 18, 2018
- INPHI CORPORATION
- Jie LIN
- G02 - OPTICS
Information Patent Application
BROADBAND SILICON NITRIDE POLARIZATION BEAM SPLITTER
- Publication number 20170357053
- Publication date Dec 14, 2017
- INPHI CORPORATION
- Jie LIN
- G02 - OPTICS

Person

Patents Grantslast 30 patents

Method and apparatus for detecting calibration requirement for imag...

Circuit for detecting low-power optical data signal

Silicon optical modulator, method for making the same

TE polarizer based on SOI platform

Temperature insensitive distributed strain monitoring apparatus and...

Wide-band multimode interference coupler with arbitrary power split...

Method for detecting low-power optical signal with high sensitivity

Colorless splitter based on SOI platform

Silicon-based polarization beam splitter

TE polarizer based on SOI platform

Silicon optical modulator, method for making the same

Method and system for identifying defects of integrated circuits

TE polarizer based on SOI platform

Mask pattern generation based on fast marching method

Dynamic updates for the inspection of integrated circuits

Care area generation for inspecting integrated circuits

TE polarizer based on SOI platform

Integrated photo detector, method of making the same

Method and system for defect prediction of integrated circuits

Guided defect detection of integrated circuits

Silicon-waveguide-based broadband polarization beam rotator

Silicon-based multiplexer/demultiplexer

Silicon-waveguide-based broadband polarization splitter-rotator

Silicon-based multiplexer/demultiplexer for O-band

Integrated photo detector, method of making the same

Silicon-waveguide-based broadband polarization splitter-rotator

Silicon-waveguide-based broadband polarization beam rotator

Broadband restricted MMI-based polarization beam splitter

Broadband restricted MMI-based polarization beam splitter

Method for forming a self-aligned mach-zehnder interferometer

Patents Applicationslast 30 patents

Multi-Junction Broadband Photodetector

Method And Apparatus For Detecting Caliberation Requirement For Ima...

Optical transceiver with multimode interferometers

ASYMMETRICAL SEMICONDUCTOR-BASED OPTICAL MODULATOR

CIRCUIT FOR DETECTING LOW-POWER OPTICAL DATA SIGNAL

TEMPERATURE INSENSITIVE DISTRIBUTED STRAIN MONITORING APPARATUS AND...

WIDE-BAND MULTIMODE INTERFERENCE COUPLER WITH ARBITRARY POWER SPLIT...

METHOD FOR DETECTING LOW-POWER OPTICAL SIGNAL WITH HIGH SENSITIVITY

TE POLARIZER BASED ON SOI PLATFORM

COLORLESS SPLITTER BASED ON SOI PLATFORM

TE POLARIZER BASED ON SOI PLATFORM

SILICON-BASED POLARIZATION BEAM SPLITTER

Dose Map Optimization for Mask Making

TE POLARIZER BASED ON SOI PLATFORM

Mask Pattern Generation Based on Fast Marching Method

SILICON-BASED MULTIPLEXER/DEMULTIPLEXER

SILICON-WAVEGUIDE-BASED BROADBAND POLARIZATION SPLITTER-ROTATOR

INTEGRATED PHOTO DETECTOR, METHOD OF MAKING THE SAME

Method and System for Defect Prediction of Integrated Circuits

Guided Defect Detection of Integrated Circuits

Method And System For Identifying Defects Of Integrated Circuits

Care Area Generation For Inspecting Integrated Circuits

Dynamic Updates for the Inspection of Integrated Circuits

BROADBAND GENERAL INTERFERENCE MMI-BASED POLARIZATION BEAM SPLITTER

SILICON-WAVEGUIDE-BASED BROADBAND POLARIZATION BEAM ROTATOR

INTEGRATED PHOTO DETECTOR, METHOD OF MAKING THE SAME

BROADBAND SILICON NITRIDE POLARIZATION BEAM SPLITTER