Jie Qin

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Highly secure and extensive scan testing of integrated circuits
- Patent number 8,977,917
- Issue date Mar 10, 2015
- Lattice Semiconductor Corporation
- Wei Han
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
HIGHLY SECURE AND EXTENSIVE SCAN TESTING OF INTEGRATED CIRCUITS
- Publication number 20140136914
- Publication date May 15, 2014
- Lattice Semiconductor Corporation
- Wei Han
- G01 - MEASURING TESTING