Jifeng Chen

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Willimantic, CT, US

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Patents Grantslast 30 patents

Information Patent Grant
Integrated time dependent dielectric breakdown reliability testing
- Patent number 9,939,486
- Issue date Apr 10, 2018
- International Business Machines Corporation
- Jifeng Chen
- G01 - MEASURING TESTING
Information Patent Grant
Integrated time dependent dielectric breakdown reliability testing
- Patent number 9,874,601
- Issue date Jan 23, 2018
- International Business Machines Corporation
- Jifeng Chen
- G01 - MEASURING TESTING
Information Patent Grant
Integrated time dependent dielectric breakdown reliability testing
- Patent number 9,557,369
- Issue date Jan 31, 2017
- International Business Machines Corporation
- Jifeng Chen
- G01 - MEASURING TESTING
Information Patent Grant
Integrated time dependent dielectric breakdown reliability testing
- Patent number 9,448,277
- Issue date Sep 20, 2016
- International Business Machines Corporation
- Jifeng Chen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED TIME DEPENDENT DIELECTRIC BREAKDOWN RELIABILITY TESTING
- Publication number 20170122999
- Publication date May 4, 2017
- Jifeng Chen
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED TIME DEPENDENT DIELECTRIC BREAKDOWN RELIABILITY TESTING
- Publication number 20170010322
- Publication date Jan 12, 2017
- International Business Machines Corporation
- JIFENG CHEN
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED TIME DEPENDENT DIELECTRIC BREAKDOWN RELIABILITY TESTING
- Publication number 20140207396
- Publication date Jul 24, 2014
- International Business Machines Corporation
- JIFENG CHEN
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED TIME DEPENDENT DIELECTRIC BREAKDOWN RELIABILITY TESTING
- Publication number 20130345997
- Publication date Dec 26, 2013
- International Business Machines Corporation
- JIFENG CHEN
- G01 - MEASURING TESTING