Jih-Jeen Chen

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Tainan, TW

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Patents Grantslast 30 patents

Information Patent Grant
Test method and architecture for circuits having inputs
- Patent number 7,159,161
- Issue date Jan 2, 2007
- National Science Council
- Kuen-Jong Lee
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Test method and architecture for circuits having inputs
- Publication number 20040153921
- Publication date Aug 5, 2004
- National Science Council
- Kuen-Jong Lee
- G01 - MEASURING TESTING