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Jihong Choi
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Fishkill, NY, US
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Patents Grants
last 30 patents
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Patent Grant
Methods relating to capacitive monitoring of layer characteristics...
Patent number
8,241,927
Issue date
Aug 14, 2012
Global Foundries, Inc.
Jihong Choi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
CMP-first damascene process scheme
Patent number
8,105,942
Issue date
Jan 31, 2012
GLOBALFOUNDRIES Inc.
Jihong Choi
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
CMP-FIRST DAMASCENE PROCESS SCHEME
Publication number
20110254139
Publication date
Oct 20, 2011
GLOBALFOUNDRIES INC.
Jihong Choi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHODS RELATING TO CAPACITIVE MONITORING OF LAYER CHARACTERISTICS...
Publication number
20110086445
Publication date
Apr 14, 2011
GLOBALFOUNDRIES INC.
Jihong Choi
H01 - BASIC ELECTRIC ELEMENTS