Jill Wang

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Hsinchu City, TW

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Patents Grantslast 30 patents

Information Patent Grant
Advanced process control with novel sampling policy
- Patent number 8,392,009
- Issue date Mar 5, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wang Jo Fei
- G05 - CONTROLLING REGULATING
Information Patent Grant
System and method for implementing a wafer acceptance test (“WAT”)...
- Patent number 8,108,060
- Issue date Jan 31, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Andy Tsen
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR IMPLEMENTING A WAFER ACCEPTANCE TEST ("WAT")...
- Publication number 20100292824
- Publication date Nov 18, 2010
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Andy Tsen
- G05 - CONTROLLING REGULATING
Information Patent Application
ADVANCED PROCESS CONTROL WITH NOVEL SAMPLING POLICY
- Publication number 20100249974
- Publication date Sep 30, 2010
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wang Jo Fei
- G05 - CONTROLLING REGULATING