Jim Chalmers

Person

Danville, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and system for enhancing the yield in semiconductor manufact...
- Patent number 10,018,996
- Issue date Jul 10, 2018
- Synopsys, Inc.
- Lars Bomholt
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and apparatus for in situ testing of gas flow controllers
- Patent number 8,667,830
- Issue date Mar 11, 2014
- Pivotal Systems Corporation
- Joseph R. Monkowski
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for enhancing in-situ gas flow measurement per...
- Patent number 8,271,211
- Issue date Sep 18, 2012
- Pivotal Systems Corporation
- Sherk Chung
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for enhancing in-situ gas flow measurement per...
- Patent number 8,271,210
- Issue date Sep 18, 2012
- Pivotal Systems Corporation
- Sherk Chung
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for enhancing in-situ gas flow measurement per...
- Patent number 8,265,888
- Issue date Sep 11, 2012
- Pivotal Systems Corporation
- Sherk Chung
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for in situ testing of gas flow controllers
- Patent number 8,240,324
- Issue date Aug 14, 2012
- Pivotal Systems Corporation
- Joseph R. Monkowski
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for enhancing the yield in semiconductor manufact...
- Patent number 8,090,464
- Issue date Jan 3, 2012
- Synopsys, Inc.
- Lars Bomholt
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and apparatus for in situ testing of gas flow controllers
- Patent number 7,823,436
- Issue date Nov 2, 2010
- Pivotal Systems Corporation
- Joseph R. Monkowski
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for enhancing the yield in semiconductor manufact...
- Patent number 7,792,595
- Issue date Sep 7, 2010
- Synopsys, Inc.
- Lars Bomholt
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR IN SITU TESTING OF GAS FLOW CONTROLLERS
- Publication number 20120304781
- Publication date Dec 6, 2012
- Pivotal Systems Corporation
- Joseph R. Monkowski
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR ENHANCING IN-SITU GAS FLOW MEASUREMENT PER...
- Publication number 20110137583
- Publication date Jun 9, 2011
- Pivotal Systems Corporation
- Sherk CHUNG
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR ENHANCING IN-SITU GAS FLOW MEASUREMENT PER...
- Publication number 20110137582
- Publication date Jun 9, 2011
- Pivotal Systems Corporation
- Sherk CHUNG
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR ENHANCING IN-SITU GAS FLOW MEASUREMENT PER...
- Publication number 20110137581
- Publication date Jun 9, 2011
- Pivotal Systems Corporation
- Sherk CHUNG
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR IN SITU TESTING OF GAS FLOW CONTROLLERS
- Publication number 20110011183
- Publication date Jan 20, 2011
- Pivotal Systems Corporation
- Joseph R. Monkowski
- G01 - MEASURING TESTING
Information Patent Application
Method and System for Enhancing the Yield In Semiconductor Manufact...
- Publication number 20100121474
- Publication date May 13, 2010
- Synopsys, Inc.
- Lars BOMHOLT
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR IN SITU TESTING OF GAS FLOW CONTROLLERS
- Publication number 20090183548
- Publication date Jul 23, 2009
- Pivotal Systems Corporation
- Joseph R. Monkowski
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR IN SITU TESTING OF GAS FLOW CONTROLLERS
- Publication number 20090183549
- Publication date Jul 23, 2009
- Pivotal Systems Corporation
- Joseph R. Monkowski
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR ENHANCING THE YIELD IN SEMICONDUCTOR MANUFACT...
- Publication number 20090005894
- Publication date Jan 1, 2009
- Synopsys, Inc.
- Lars BOMHOLT
- G06 - COMPUTING CALCULATING COUNTING

Jim Chalmers

Person

Patents Grantslast 30 patents

Method and system for enhancing the yield in semiconductor manufact...

Method and apparatus for in situ testing of gas flow controllers

Method and apparatus for enhancing in-situ gas flow measurement per...

Method and apparatus for enhancing in-situ gas flow measurement per...

Method and apparatus for enhancing in-situ gas flow measurement per...

Method and apparatus for in situ testing of gas flow controllers

Method and system for enhancing the yield in semiconductor manufact...

Method and apparatus for in situ testing of gas flow controllers

Method and system for enhancing the yield in semiconductor manufact...

Patents Applicationslast 30 patents

METHOD AND APPARATUS FOR IN SITU TESTING OF GAS FLOW CONTROLLERS

METHOD AND APPARATUS FOR ENHANCING IN-SITU GAS FLOW MEASUREMENT PER...

METHOD AND APPARATUS FOR ENHANCING IN-SITU GAS FLOW MEASUREMENT PER...

METHOD AND APPARATUS FOR ENHANCING IN-SITU GAS FLOW MEASUREMENT PER...

METHOD AND APPARATUS FOR IN SITU TESTING OF GAS FLOW CONTROLLERS

Method and System for Enhancing the Yield In Semiconductor Manufact...

METHOD AND APPARATUS FOR IN SITU TESTING OF GAS FLOW CONTROLLERS

METHOD AND APPARATUS FOR IN SITU TESTING OF GAS FLOW CONTROLLERS

METHOD AND SYSTEM FOR ENHANCING THE YIELD IN SEMICONDUCTOR MANUFACT...