Jim Zhang

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Livermore, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Probe card assembly for testing electronic devices
- Patent number 9,588,139
- Issue date Mar 7, 2017
- FormFactor, Inc.
- Li Fan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Probe Card Assembly For Testing Electronic Devices
- Publication number 20140327461
- Publication date Nov 6, 2014
- FormFactor, Inc.
- Li Fan
- G01 - MEASURING TESTING