Jimmy Vishnipolsky

Follow

Person

Petah Tikva, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Inspection of EUV masks by a DUV mask inspection tool
- Patent number 8,207,504
- Issue date Jun 26, 2012
- Applied Materials Israel, Ltd.
- Chaim Braude
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Raster frame beam system for electron beam lithography
- Patent number 7,842,935
- Issue date Nov 30, 2010
- Applied Materials Israel, Ltd.
- Meir Aloni
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Raster frame beam system for electron beam lithography
- Patent number 7,521,700
- Issue date Apr 21, 2009
- Applied Materials, Israel, Ltd.
- Meir Aloni
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Raster frame beam system for electron beam lithography
- Patent number 7,098,468
- Issue date Aug 29, 2006
- Applied Materials, Inc.
- Meir Aloni
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION OF EUV MASKS BY A DUV MASK INSPECTION TOOL
- Publication number 20110121193
- Publication date May 26, 2011
- APPLIED MATERIALS ISRAEL LIMITED
- Chaim Braude
- B82 - NANO-TECHNOLOGY
Information Patent Application
Raster Frame Beam System For Electron Beam Lithography
- Publication number 20060243918
- Publication date Nov 2, 2006
- Meir Aloni
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Raster Frame Beam System For Electron Beam Lithography
- Publication number 20060243922
- Publication date Nov 2, 2006
- Meir Aloni
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Raster frame beam system for electron beam lithography
- Publication number 20050274911
- Publication date Dec 15, 2005
- Meir Aloni
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY