Jimmy W. Hosch

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Dallas, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Electron beam exciter for use in chemical analysis in processing sy...
- Patent number 9,997,325
- Issue date Jun 12, 2018
- Verity Instruments, Inc.
- Jimmy W. Hosch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for determining endpoint in etch processes using...
- Patent number 6,830,939
- Issue date Dec 14, 2004
- Verity Instruments, Inc.
- Kenneth C. Harvey
- G01 - MEASURING TESTING
Information Patent Grant
Diffraction gratings for submicron linewidth measurement
- Patent number 5,422,723
- Issue date Jun 6, 1995
- Texas Instruments Incorporated
- Ajit P. Paranjpe
- G01 - MEASURING TESTING
Information Patent Grant
Process control for submicron linewidth measurement
- Patent number 5,361,137
- Issue date Nov 1, 1994
- Texas Instruments Incorporated
- Thomas J. Aton
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Electron beam exciter for use in chemical analysis in processing sy...
- Publication number 20100032587
- Publication date Feb 11, 2010
- Jimmy W. Hosch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and method for determining endpoint in etch processes using...
- Publication number 20040045934
- Publication date Mar 11, 2004
- Kenneth C. Harvey
- G01 - MEASURING TESTING