Jimpei Harada

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Diffraction condition simulation device, diffraction measurement sy...
- Patent number 7,337,098
- Issue date Feb 26, 2008
- Rigaku Corporation
- Ryouichi Yokoyama
- G01 - MEASURING TESTING
Information Patent Grant
Beam conditioning system with sequential optic
- Patent number 7,280,634
- Issue date Oct 9, 2007
- Osmic, Inc.
- Boris Verman
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Beam conditioning system
- Patent number 7,076,026
- Issue date Jul 11, 2006
- Osmic, Inc.
- Boris Verman
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method and apparatus for measuring thin film, and thin film deposit...
- Patent number 6,970,532
- Issue date Nov 29, 2005
- Rigaku Corporation
- Seiichi Hayashi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Apparatus for X-ray analysis and apparatus for supplying X-rays
- Patent number 6,823,042
- Issue date Nov 23, 2004
- Rigaku Corporation
- Seiichi Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Fluorescent x-ray analyzing method and apprartus
- Patent number 6,385,281
- Issue date May 7, 2002
- Rigaku Corporation
- Tetsuya Ozawa
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for x-ray analysis
- Patent number 6,249,566
- Issue date Jun 19, 2001
- Rigaku Corporation
- Seiichi Hayashi
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method and apparatus of automatically selecting bragg reflections,...
- Patent number 6,198,796
- Issue date Mar 6, 2001
- Rigaku Corporation
- Ryoichi Yokoyama
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Beam conditioning system with sequential optic
- Publication number 20060239405
- Publication date Oct 26, 2006
- Osmic, Inc.
- Boris Verman
- B82 - NANO-TECHNOLOGY
Information Patent Application
Beam conditioning system
- Publication number 20050025281
- Publication date Feb 3, 2005
- Boris Verman
- B82 - NANO-TECHNOLOGY
Information Patent Application
Diffraction condition simulation device, diffraction measurement sy...
- Publication number 20030009316
- Publication date Jan 9, 2003
- Ryouichi Yokoyama
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for X-ray analysis and apparatus for supplying X-rays
- Publication number 20030007599
- Publication date Jan 9, 2003
- Rigaku Corporation
- Seiichi Hayashi
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for measuring thin film, and thin film deposit...
- Publication number 20010043668
- Publication date Nov 22, 2001
- Rigaku Corporation
- Seiichi Hayashi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Jimpei Harada

Person

Patents Grantslast 30 patents

Diffraction condition simulation device, diffraction measurement sy...

Beam conditioning system with sequential optic

Beam conditioning system

Method and apparatus for measuring thin film, and thin film deposit...

Apparatus for X-ray analysis and apparatus for supplying X-rays

Fluorescent x-ray analyzing method and apprartus

Apparatus for x-ray analysis

Method and apparatus of automatically selecting bragg reflections,...

Patents Applicationslast 30 patents

Beam conditioning system with sequential optic

Beam conditioning system

Diffraction condition simulation device, diffraction measurement sy...

Apparatus for X-ray analysis and apparatus for supplying X-rays

Method and apparatus for measuring thin film, and thin film deposit...