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Eindhoven, NL
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Patents Grants
last 30 patents
Information
Patent Grant
Method of measuring a parameter of a lithographic process, metrolog...
Patent number
11,099,489
Issue date
Aug 24, 2021
ASML Netherlands B.V.
Hugo Augustinus Joseph Cramer
G01 - MEASURING TESTING
Information
Patent Grant
Measurement apparatus and method of measuring a target
Patent number
11,042,100
Issue date
Jun 22, 2021
ASML Netherlands B.V.
Jin Lian
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Metrology apparatus, lithographic system, and method of measuring a...
Patent number
10,908,514
Issue date
Feb 2, 2021
ASML Netherlands B.V.
Janneke Ravensbergen
G01 - MEASURING TESTING
Information
Patent Grant
Method for of measuring a parameter relating to a structure formed...
Patent number
10,831,107
Issue date
Nov 10, 2020
ASML Netherlands B.V.
Sergei Sokolov
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method of measuring a parameter of interest, device manufacturing m...
Patent number
10,788,758
Issue date
Sep 29, 2020
ASML Netherlands B.V.
Jin Lian
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Metrology method and apparatus, computer program and lithographic s...
Patent number
10,705,437
Issue date
Jul 7, 2020
ASML Netherlands B.V.
Narjes Javaheri
G01 - MEASURING TESTING
Information
Patent Grant
Method of measuring, device manufacturing method, metrology apparat...
Patent number
10,656,534
Issue date
May 19, 2020
ASML Netherlands B.V.
Nitesh Pandey
G01 - MEASURING TESTING
Information
Patent Grant
Metrology apparatus, lithographic system, and method of measuring a...
Patent number
10,444,640
Issue date
Oct 15, 2019
ASML Netherlands B.V.
Janneke Ravensbergen
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method of measuring, device manufacturing method, metrology apparat...
Patent number
10,310,389
Issue date
Jun 4, 2019
ASML Netherlands B.V.
Nitesh Pandey
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METROLOGY TOOL CALIBRATION METHOD AND ASSOCIATED METROLOGY TOOL
Publication number
20240184215
Publication date
Jun 6, 2024
ASML NETHERLANDS B.V.
Jin LIAN
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
METROLOGY SYSTEM AND COHERENCE ADJUSTERS
Publication number
20240027913
Publication date
Jan 25, 2024
ASML NETHERLANDS B.V.
Sergei SOKOLOV
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
METHODS AND PATTERNING DEVICES AND APPARATUSES FOR MEASURING FOCUS...
Publication number
20230305407
Publication date
Sep 28, 2023
ASML NETHERLANDS B.V.
Fei LIU
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
ILLUMINATION APPARATUS AND ASSOCIATED METROLOGY AND LITHOGRAPHIC AP...
Publication number
20230229094
Publication date
Jul 20, 2023
ASML NETHERLANDS B.V.
Simon Reinald HUISMAN
G02 - OPTICS
Information
Patent Application
A SUBSTRATE COMPRISING A TARGET ARRANGEMENT, AND ASSOCIATED AT LEAS...
Publication number
20230176491
Publication date
Jun 8, 2023
ASML NETHERLANDS B.V.
Olger Victor ZWIER
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Method of Measuring a Parameter of a Lithographic Process, Metrolog...
Publication number
20200192231
Publication date
Jun 18, 2020
ASML NETHERLANDS B.V.
Hugo Augustinus Joseph CRAMER
G01 - MEASURING TESTING
Information
Patent Application
Method for of Measuring a Parameter Relating to a Structure Formed...
Publication number
20200089125
Publication date
Mar 19, 2020
ASML NETHERLANDS B.V.
Sergei SOKOLOV
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
METROLOGY APPARATUS, LITHOGRAPHIC SYSTEM, AND METHOD OF MEASURING A...
Publication number
20200004165
Publication date
Jan 2, 2020
ASML NETHERLANDS B.V.
Janneke RAVENSBERGEN
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Measurement Apparatus and Method of Measuring a Target
Publication number
20190369505
Publication date
Dec 5, 2019
ASML NETHERLANDS B.V.
Jin LIAN
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
METHOD OF MEASURING, DEVICE MANUFACTURING METHOD, METROLOGY APPARAT...
Publication number
20190285993
Publication date
Sep 19, 2019
ASML NETHERLANDS B.V.
Nitesh PANDEY
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
METROLOGY APPARATUS, LITHOGRAPHIC SYSTEM, AND METHOD OF MEASURING A...
Publication number
20190113852
Publication date
Apr 18, 2019
ASML NETHERLANDS B.V.
Janneke RAVENSBERGEN
G01 - MEASURING TESTING
Information
Patent Application
Metrology Method and Apparatus, Computer Program and Lithographic S...
Publication number
20190107785
Publication date
Apr 11, 2019
ASML NETHERLANDS B.V.
Narjes JAVAHERI
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Method of Measuring a Parameter of Interest, Device Manufacturing M...
Publication number
20180321598
Publication date
Nov 8, 2018
ASML NETHERLANDS B.V.
Jin LIAN
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
METHOD OF MEASURING, DEVICE MANUFACTURING METHOD, METROLOGY APPARAT...
Publication number
20180299794
Publication date
Oct 18, 2018
ASML NETHERLANDS B.V.
Nitesh PANDEY
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY