Jin Liu

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Lewisville, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Self-isolating mixed design-rule integrated yield monitor
- Patent number 9,222,969
- Issue date Dec 29, 2015
- Texas Instruments Incoporated
- Jin Liu
- G01 - MEASURING TESTING
Information Patent Grant
Self-isolating mixed design-rule integrated yield monitor
- Patent number 8,258,806
- Issue date Sep 4, 2012
- Texas Instruments Incorporated
- Jin Liu
- G01 - MEASURING TESTING
Information Patent Grant
System and method for the analysis of semiconductor test data
- Patent number 7,171,335
- Issue date Jan 30, 2007
- Texas Instruments Incorporated
- Jin Liu
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit testing device and a method of use therefor
- Patent number 6,873,146
- Issue date Mar 29, 2005
- Texas Instruments Incorporated
- Jin Liu
- G01 - MEASURING TESTING
Information Patent Grant
Bipolar transistor having high emitter efficiency
- Patent number 6,114,745
- Issue date Sep 5, 2000
- STMicroelectronics, Inc.
- Ming Fang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SELF-ISOLATING MIXED DESIGN-RULE INTEGRATED YIELD MONITOR
- Publication number 20120326739
- Publication date Dec 27, 2012
- TEXAS INSTRUMENTS INCORPORATED
- Jin Liu
- G01 - MEASURING TESTING
Information Patent Application
SELF-ISOLATING MIXED DESIGN-RULE INTEGRATED YEILD MONITOR
- Publication number 20090160466
- Publication date Jun 25, 2009
- TEXAS INSTRUMENTS INCORPORATED
- Jin Liu
- G01 - MEASURING TESTING
Information Patent Application
System and method for the analysis of semiconductor test data
- Publication number 20060136174
- Publication date Jun 22, 2006
- TEXAS INSTRUMENTS INCORPORATED
- Jin Liu
- G01 - MEASURING TESTING
Information Patent Application
Integrated circuit testing device and a method of use therefor
- Publication number 20040178787
- Publication date Sep 16, 2004
- TEXAS INSTRUMENTS INCORPORATED
- Jin Liu
- G01 - MEASURING TESTING