Jin Xing Chen

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Wuhan, CN

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Patents Grantslast 30 patents

Information Patent Grant
Inspection system of semiconductor device and related inspection me...
- Patent number 11,333,614
- Issue date May 17, 2022
- Yangtze Memory Technologies Co., Ltd.
- Guangdian Chen
- G01 - MEASURING TESTING
Information Patent Grant
Method for calibrating verticality of particle beam and system appl...
- Patent number 11,112,482
- Issue date Sep 7, 2021
- Yangtze Memory Technologies Co., Ltd.
- Guangdian Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for detecting defects in deep features with laser enhanced e...
- Patent number 10,823,683
- Issue date Nov 3, 2020
- Yangtze Memory Technologies Co., Ltd.
- Sheng Chao Nie
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION SYSTEM OF SEMICONDUCTOR DEVICE AND RELATED INSPECTION ME...
- Publication number 20210172879
- Publication date Jun 10, 2021
- Yangtze Memory Technologies Co., Ltd.
- Guangdian Chen
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CALIBRATING VERTICALITY OF PARTICLE BEAM AND SYSTEM APPL...
- Publication number 20210132174
- Publication date May 6, 2021
- Yangtze Memory Technologies Co., Ltd.
- Guangdian Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DETECTING DEFECTS IN DEEP FEATURES
- Publication number 20210109034
- Publication date Apr 15, 2021
- Yangtze Memory Technologies Co., Ltd.
- SHENG CHAO NIE
- G01 - MEASURING TESTING