Jin Zheng Wallner

Person

Pleasant Valley, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Epitaxial structures of semiconductor devices that are independent...
- Patent number 11,056,591
- Issue date Jul 6, 2021
- GLOBALFOUNDRIES U.S. INC.
- Jin Wallner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Self-aligned single diffusion break for fully depleted silicon-on-i...
- Patent number 10,580,684
- Issue date Mar 3, 2020
- GLOBALFOUNDRIES Inc.
- Jin Wallner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Diffusion break forming after source/drain forming and related IC s...
- Patent number 9,917,103
- Issue date Mar 13, 2018
- GLOBALFOUNDRIES Inc.
- George R. Mulfinger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Etch stop liner for contact punch through mitigation in SOI substrate
- Patent number 9,899,257
- Issue date Feb 20, 2018
- GLOBALFOUNDRIES Inc.
- Jin Z. Wallner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for providing variable feature widths in a self-aligned spa...
- Patent number 9,887,135
- Issue date Feb 6, 2018
- GLOBALFOUNDRIES Inc.
- Jin Wallner
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Multi-layered integrated circuit with selective temperature coeffic...
- Patent number 9,418,982
- Issue date Aug 16, 2016
- International Business Machines Corporation
- Yanqing Deng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for embedded diamond-shaped stress element
- Patent number 9,412,843
- Issue date Aug 9, 2016
- International Business Machines Corporation
- Eric C. Harley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
FinFET formation with late fin reveal
- Patent number 9,171,935
- Issue date Oct 27, 2015
- GLOBALFOUNDRIES Inc.
- Seong-Dong Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Overlapping contacts for semiconductor device
- Patent number 8,940,634
- Issue date Jan 27, 2015
- International Business Machines Corporation
- Brett H. Engel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Static random access memory test structure
- Patent number 8,787,074
- Issue date Jul 22, 2014
- International Business Machines Corporation
- Oliver D. Patterson
- G11 - INFORMATION STORAGE
Information Patent Grant
Multiple exposure and single etch integration method
- Patent number 8,124,534
- Issue date Feb 28, 2012
- International Business Machines Corporation
- Jin Wallner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for transistor fabrication with optimized performance
- Patent number 7,883,953
- Issue date Feb 8, 2011
- FREESCALE SEMICONDUCTOR, INC.
- Da Zhang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
EPITAXIAL STRUCTURES OF SEMICONDUCTOR DEVICES THAT ARE INDEPENDENT...
- Publication number 20200328306
- Publication date Oct 15, 2020
- GLOBALFOUNDRIES INC.
- Jin Wallner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELF-ALIGNED SINGLE DIFFUSION BREAK FOR FULLY DEPLETED SILICON-ON-I...
- Publication number 20190318955
- Publication date Oct 17, 2019
- GLOBALFOUNDRIES INC.
- Jin WALLNER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-LAYERED INTEGRATED CIRCUIT WITH SELECTIVE TEMPERATURE COEFFIC...
- Publication number 20160181239
- Publication date Jun 23, 2016
- International Business Machines Corporation
- Yanqing Deng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR EMBEDDED DIAMOND-SHAPED STRESS ELEMENT
- Publication number 20150340465
- Publication date Nov 26, 2015
- International Business Machines Corporation
- Eric C. Harley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FinFET FORMATION WITH LATE FIN REVEAL
- Publication number 20150255569
- Publication date Sep 10, 2015
- International Business Machines Corporation
- Seong-Dong Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OVERLAPPING CONTACTS FOR SEMICONDUCTOR DEVICE
- Publication number 20130241070
- Publication date Sep 19, 2013
- International Business Machines Corporation
- Brett H. Engel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STATIC RANDOM ACCESS MEMORY TEST STRUCTURE
- Publication number 20130094315
- Publication date Apr 18, 2013
- International Business Machines Corporation
- Oliver D. Patterson
- G11 - INFORMATION STORAGE
Information Patent Application
OVERLAPPING CONTACTS FOR SEMICONDUCTOR DEVICE
- Publication number 20130001786
- Publication date Jan 3, 2013
- International Business Machines Corporation
- Brett H. Engel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Transistor Fabrication with Optimized Performance
- Publication number 20100078687
- Publication date Apr 1, 2010
- Da Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLE EXPOSURE AND SINGLE ETCH INTEGRATION METHOD
- Publication number 20100022088
- Publication date Jan 28, 2010
- International Business Machines Corporation
- Jin Wallner
- H01 - BASIC ELECTRIC ELEMENTS

Jin Zheng Wallner

Person

Patents Grantslast 30 patents

Epitaxial structures of semiconductor devices that are independent...

Self-aligned single diffusion break for fully depleted silicon-on-i...

Diffusion break forming after source/drain forming and related IC s...

Etch stop liner for contact punch through mitigation in SOI substrate

Methods for providing variable feature widths in a self-aligned spa...

Multi-layered integrated circuit with selective temperature coeffic...

Method for embedded diamond-shaped stress element

FinFET formation with late fin reveal

Overlapping contacts for semiconductor device

Static random access memory test structure

Multiple exposure and single etch integration method

Method for transistor fabrication with optimized performance

Patents Applicationslast 30 patents

EPITAXIAL STRUCTURES OF SEMICONDUCTOR DEVICES THAT ARE INDEPENDENT...

SELF-ALIGNED SINGLE DIFFUSION BREAK FOR FULLY DEPLETED SILICON-ON-I...

MULTI-LAYERED INTEGRATED CIRCUIT WITH SELECTIVE TEMPERATURE COEFFIC...

METHOD FOR EMBEDDED DIAMOND-SHAPED STRESS ELEMENT

FinFET FORMATION WITH LATE FIN REVEAL

OVERLAPPING CONTACTS FOR SEMICONDUCTOR DEVICE

STATIC RANDOM ACCESS MEMORY TEST STRUCTURE

OVERLAPPING CONTACTS FOR SEMICONDUCTOR DEVICE

Method for Transistor Fabrication with Optimized Performance

MULTIPLE EXPOSURE AND SINGLE ETCH INTEGRATION METHOD