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Jinbo Kuang
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Acton, MA, US
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Patents Grants
last 30 patents
Information
Patent Grant
3-axis gyroscope with rotational vibration rejection
Patent number
11,774,244
Issue date
Oct 3, 2023
Analog Devices, Inc.
Jeffrey A. Gregory
G01 - MEASURING TESTING
Information
Patent Grant
3-axis gyroscope with rotational vibration rejection
Patent number
11,193,771
Issue date
Dec 7, 2021
Analog Devices, Inc.
Jeffrey A. Gregory
G01 - MEASURING TESTING
Information
Patent Grant
Vertical stopper for capping MEMS devices
Patent number
10,882,735
Issue date
Jan 5, 2021
Analog Devices, Inc.
Jinbo Kuang
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Quad proof mass MEMS gyroscope with outer couplers and related methods
Patent number
10,514,259
Issue date
Dec 24, 2019
Analog Devices, Inc.
Kemiao Jia
G01 - MEASURING TESTING
Information
Patent Grant
Vertical stopper for capping MEMS devices
Patent number
10,239,746
Issue date
Mar 26, 2019
Analog Devices, Inc.
Jinbo Kuang
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Piezoelectric transducers
Patent number
8,555,718
Issue date
Oct 15, 2013
Analog Devices, Inc.
Jinbo Kuang
G01 - MEASURING TESTING
Information
Patent Grant
Inertial sensors using piezoelectric transducers
Patent number
8,549,918
Issue date
Oct 8, 2013
Analog Devices, Inc.
Jinbo Kuang
G01 - MEASURING TESTING
Information
Patent Grant
Piezoelectric transducers and inertial sensors using piezoelectric...
Patent number
8,408,060
Issue date
Apr 2, 2013
Analog Devices, Inc.
Jinbo Kuang
G01 - MEASURING TESTING
Information
Patent Grant
MEMS device with roughened surface and method of producing the same
Patent number
8,389,314
Issue date
Mar 5, 2013
Analog Devices, Inc.
John R. Martin
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Inertial sensors with reduced sensitivity to quadrature errors and...
Patent number
8,266,961
Issue date
Sep 18, 2012
Analog Devices, Inc.
Jinbo Kuang
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for a micromachined multisensor
Patent number
7,980,133
Issue date
Jul 19, 2011
Analog Devices, Inc.
John A. Geen
G01 - MEASURING TESTING
Information
Patent Grant
Cross-quad and vertically coupled inertial sensors
Patent number
7,421,897
Issue date
Sep 9, 2008
Analog Devices, Inc.
John A. Geen
G01 - MEASURING TESTING
Information
Patent Grant
Coupling apparatus for inertial sensors
Patent number
7,347,094
Issue date
Mar 25, 2008
Analog Devices, Inc.
John A. Geen
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
3-AXIS GYROSCOPE WITH ROTATIONAL VIBRATION REJECTION
Publication number
20220057210
Publication date
Feb 24, 2022
Analog Devices, Inc.
Jeffrey A. Gregory
G01 - MEASURING TESTING
Information
Patent Application
3-AXIS GYROSCOPE WITH ROTATIONAL VIBRATION REJECTION
Publication number
20210381834
Publication date
Dec 9, 2021
Analog Devices, Inc.
Jeffrey A. Gregory
G01 - MEASURING TESTING
Information
Patent Application
VERTICAL STOPPER FOR CAPPING MEMS DEVICES
Publication number
20190152766
Publication date
May 23, 2019
Analog Devices, Inc.
Jinbo Kuang
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
VERTICAL STOPPER FOR CAPPING MEMS DEVICES
Publication number
20180134543
Publication date
May 17, 2018
Analog Devices, Inc.
Jinbo Kuang
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
QUAD PROOF MASS MEMS GYROSCOPE WITH OUTER COUPLERS AND RELATED METHODS
Publication number
20180058853
Publication date
Mar 1, 2018
Analog Devices, Inc.
Kemiao Jia
G01 - MEASURING TESTING
Information
Patent Application
Inertial Sensors Using Piezoelectric Transducers
Publication number
20130167639
Publication date
Jul 4, 2013
Analog Devices, Inc.
Jinbo Kuang
G01 - MEASURING TESTING
Information
Patent Application
Piezoelectric Transducers
Publication number
20130167642
Publication date
Jul 4, 2013
Analog Devices, Inc.
Jinbo Kuang
G01 - MEASURING TESTING
Information
Patent Application
Piezoelectric Transducers and Inertial Sensors using Piezoelectric...
Publication number
20120210790
Publication date
Aug 23, 2012
Analog Devices, Inc.
Jinbo Kuang
G01 - MEASURING TESTING
Information
Patent Application
Inertial Sensors with Reduced Sensitivity to Quadrature Errors and...
Publication number
20110030474
Publication date
Feb 10, 2011
Analog Devices, Inc.
Jinbo Kuang
G01 - MEASURING TESTING
Information
Patent Application
Piezoelectric Transducers and Inertial Sensors using Piezoelectric...
Publication number
20100058861
Publication date
Mar 11, 2010
Analog Devices, Inc.
Jinbo Kuang
G01 - MEASURING TESTING
Information
Patent Application
Method and Apparatus for a Micromachined Multisensor
Publication number
20100043551
Publication date
Feb 25, 2010
Analog Devices, Inc.
John A. Geen
G01 - MEASURING TESTING
Information
Patent Application
MEMS Device with Roughened Surface and Method of Producing the Same
Publication number
20080081391
Publication date
Apr 3, 2008
Analog Devices, Inc.
John R. Martin
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Cross-quad and vertically coupled inertial sensors
Publication number
20060230830
Publication date
Oct 19, 2006
John A. Geen
G01 - MEASURING TESTING
Information
Patent Application
Coupling apparatus for inertial sensors
Publication number
20050229703
Publication date
Oct 20, 2005
John A. Geen
G01 - MEASURING TESTING