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Jinchi Zhang
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Quebec, CA
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Patents Grants
last 30 patents
Information
Patent Grant
Ultrasonic measurement of surface profile and average diameter of a...
Patent number
11,927,437
Issue date
Mar 12, 2024
Evident Scientific, Inc.
Jinchi Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Ultrasound probe with row-column addressed array
Patent number
11,448,621
Issue date
Sep 20, 2022
Olympus NDT Canada Inc.
Jinchi Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Ultrasound probe with row-column addressed array
Patent number
11,408,860
Issue date
Aug 9, 2022
Olympus NDT Canada Inc.
Jinchi Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Ultrasonic measurement of surface profile and average diameter of a...
Patent number
10,982,955
Issue date
Apr 20, 2021
Olympus America Inc.
Jinchi Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for measuring wall thickness, ovality of tubul...
Patent number
10,962,358
Issue date
Mar 30, 2021
Olympus America Inc.
Jinchi Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Phased array system capable of computing gains for non-measured cal...
Patent number
10,101,304
Issue date
Oct 16, 2018
Jinchi Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Phased-array probe and a phased-array search unit
Patent number
9,964,526
Issue date
May 8, 2018
Olympus Scientific Solutions Americas Inc.
Jinchi Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Focusing wedge for ultrasonic testing
Patent number
9,952,183
Issue date
Apr 24, 2018
Olympus Scientific Solutions America
Jinchi Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Method of and an apparatus conducting calibration for phased-array...
Patent number
9,279,786
Issue date
Mar 8, 2016
Olympus NDT
Jinchi Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Monitoring temperature variation in wedge of phased-array probe for...
Patent number
9,279,785
Issue date
Mar 8, 2016
Olympus NDT
Jinchi Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Sizing of a defect using phased array system
Patent number
9,222,918
Issue date
Dec 29, 2015
Olympus Scientific Solutions Americas Inc.
Martin St-Laurent
G01 - MEASURING TESTING
Information
Patent Grant
Method and system of using 1.5D phased array probe for cylindrical...
Patent number
9,080,951
Issue date
Jul 14, 2015
Olympus Scientific Solutions Americas Inc.
Jason Habermehl
G01 - MEASURING TESTING
Information
Patent Grant
Phased array system and method for inspecting helical submerged arc...
Patent number
9,032,802
Issue date
May 19, 2015
OLYMPUS NDT
Christophe Imbert
G01 - MEASURING TESTING
Information
Patent Grant
System and method of conducting refraction angle verification for p...
Patent number
8,521,446
Issue date
Aug 27, 2013
Olympus NDT Inc.
Jinchi Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Weld seam tracking system using phased array ultrasonic devices
Patent number
8,365,602
Issue date
Feb 5, 2013
Olympus NDT, Inc.
Christophe Claude Imbert
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
REDUCTION OF CROSSTALK IN ROW-COLUMN ADDRESSED ARRAY PROBES
Publication number
20240410861
Publication date
Dec 12, 2024
Evident Canada, Inc.
Jinchi Zhang
G01 - MEASURING TESTING
Information
Patent Application
ADAPTIVE ULTRASONIC INSPECTION FOR VOLUMETRIC FLAWS
Publication number
20240369515
Publication date
Nov 7, 2024
Benoit Lepage
G01 - MEASURING TESTING
Information
Patent Application
CONTEMPORANEOUS FIRING SCHEME FOR ACOUSTIC INSPECTION
Publication number
20240142619
Publication date
May 2, 2024
Benoit Lepage
G01 - MEASURING TESTING
Information
Patent Application
ULTRASOUND PROBE WITH ROW-COLUMN ADDRESSED ARRAY
Publication number
20210302388
Publication date
Sep 30, 2021
Olympus NDT Canada Inc.
Jinchi Zhang
G01 - MEASURING TESTING
Information
Patent Application
ULTRASOUND PROBE WITH ROW-COLUMN ADDRESSED ARRAY
Publication number
20210302383
Publication date
Sep 30, 2021
Olympus NDT Canada Inc.
Jinchi Zhang
G01 - MEASURING TESTING
Information
Patent Application
ULTRASONIC MEASUREMENT OF SURFACE PROFILE AND AVERAGE DIAMETER OF A...
Publication number
20210223036
Publication date
Jul 22, 2021
Jinchi Zhang
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR MEASURING WALL THICKNESS, OVALITY OF TUBUL...
Publication number
20200018593
Publication date
Jan 16, 2020
Olympus Scientific Solutions Americas Inc.
Jinchi Zhang
G01 - MEASURING TESTING
Information
Patent Application
ULTRASONIC MEASUREMENT OF SURFACE PROFILE AND AVERAGE DIAMETER OF A...
Publication number
20200018594
Publication date
Jan 16, 2020
Olympus Scientific Solutions Americas Inc.
Jinchi Zhang
G01 - MEASURING TESTING
Information
Patent Application
FOCUSING WEDGE FOR ULTRASONIC TESTING
Publication number
20170074831
Publication date
Mar 16, 2017
Olympus Scientific Solutions Americas Inc.
Jinchi Zhang
G01 - MEASURING TESTING
Information
Patent Application
PHASED-ARRAY PROBE AND A PHASED-ARRAY SEARCH UNIT
Publication number
20160290973
Publication date
Oct 6, 2016
Olympus Scientific Solutions Americas Inc.
Jinchi Zhang
G01 - MEASURING TESTING
Information
Patent Application
PHASED ARRAY SYSTEM CAPABLE OF COMPUTING GAINS FOR NON-MEASURED CAL...
Publication number
20150377840
Publication date
Dec 31, 2015
Olympus Scientific Solutions Americas Inc.
Jinchi Zhang
G01 - MEASURING TESTING
Information
Patent Application
MONITORING TEMPERATURE VARIATION IN WEDGE OF PHASED-ARRAY PROBE FOR...
Publication number
20140352436
Publication date
Dec 4, 2014
Jinchi ZHANG
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND A METHOD OF ADAPTIVE FOCUSING IN A PHASED ARRAY ULTRASON...
Publication number
20140283611
Publication date
Sep 25, 2014
Jason Habermehl
G01 - MEASURING TESTING
Information
Patent Application
SIZING OF A DEFECT USING PHASED ARRAY SYSTEM
Publication number
20140236499
Publication date
Aug 21, 2014
OLYMPUS NDT, INC.
Martin St-Laurent
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM OF USING 1.5D PHASED ARRAY PROBE FOR CYLINDRICAL...
Publication number
20130283918
Publication date
Oct 31, 2013
Olympus NDT Inc.
Jason Habermehl
G01 - MEASURING TESTING
Information
Patent Application
PHASED ARRAY SYSTEM AND METHOD FOR INSPECTING HELLICAL SUBMERGED AR...
Publication number
20130199297
Publication date
Aug 8, 2013
Christophe Imbert
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF AND AN APPARATUS CONDUCTING CALIBRATION FOR PHASED-ARRAY...
Publication number
20130047697
Publication date
Feb 28, 2013
Jinchi ZHANG
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD OF CONDUCTING REFRACTION ANGLE VERIFICATION FOR P...
Publication number
20120130653
Publication date
May 24, 2012
Olympus NDT, Inc.
Jinchi ZHANG
G01 - MEASURING TESTING
Information
Patent Application
WELD SEAM TRACKING SYSTEM USING PHASED ARRAY ULTRASONIC DEVICES
Publication number
20110083512
Publication date
Apr 14, 2011
Christophe Claude Imbert
G01 - MEASURING TESTING