Jing SU

Person

Fremont, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Determining pattern ranking based on measurement feedback from prin...
- Patent number 12,038,694
- Issue date Jul 16, 2024
- ASML Netherlands B.V.
- Youping Zhang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Training methods for machine learning assisted optical proximity er...
- Patent number 11,768,440
- Issue date Sep 26, 2023
- ASML Netherlands B.V.
- Jing Su
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for determining curvilinear patterns for patterning device
- Patent number 11,734,490
- Issue date Aug 22, 2023
- ASML Netherlands B.V.
- Quan Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Determining pattern ranking based on measurement feedback from prin...
- Patent number 11,635,699
- Issue date Apr 25, 2023
- ASML Netherlands B.V.
- Youping Zhang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Training methods for machine learning assisted optical proximity er...
- Patent number 11,561,477
- Issue date Jan 24, 2023
- ASML Netherlands B.V.
- Jing Su
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Identification of hot spots or defects by machine learning
- Patent number 11,443,083
- Issue date Sep 13, 2022
- ASML Netherlands B.V.
- Jing Su
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for determining curvilinear patterns for patterning device
- Patent number 11,232,249
- Issue date Jan 25, 2022
- ASML Netherlands B.V.
- Quan Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Coloring aware optimization
- Patent number 10,670,973
- Issue date Jun 2, 2020
- ASML Netherlands B.V.
- Yi Zou
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
TRAINING METHODS FOR MACHINE LEARNING ASSISTED OPTICAL PROXIMITY ER...
- Publication number 20240012335
- Publication date Jan 11, 2024
- ASML NETHERLANDS B.V.
- Jing SU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TRAINING METHODS FOR MACHINE LEARNING ASSISTED OPTICAL PROXIMITY ER...
- Publication number 20230137097
- Publication date May 4, 2023
- ASML NETHERLANDS B.V.
- Jing SU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS FOR GENERATING CHARACTERISTIC PATTERN AND TRAINING MACHINE...
- Publication number 20220335333
- Publication date Oct 20, 2022
- ASML NETHERLANDS B.V.
- Yu CAO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MODELING METHOD FOR COMPUTATIONAL FINGERPRINTS
- Publication number 20220291590
- Publication date Sep 15, 2022
- ASML NETHERLANDS B.V.
- Jing SU
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
IDENTIFICATION OF HOT SPOTS OR DEFECTS BY MACHINE LEARNING
- Publication number 20220277116
- Publication date Sep 1, 2022
- ASML NETHERLANDS B.V.
- Jing SU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR TRAINING MACHINE LEARNING MODEL TO DETERMINE OPTICAL PRO...
- Publication number 20220137503
- Publication date May 5, 2022
- ASML NETHERLANDS B.V.
- Jun TAO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DETERMINING CURVILINEAR PATTERNS FOR PATTERNING DEVICE
- Publication number 20220121804
- Publication date Apr 21, 2022
- ASML Netherland B.V.
- Quan Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERMINING PATTERN RANKING BASED ON MEASUREMENT FEEDBACK FROM PRIN...
- Publication number 20220043356
- Publication date Feb 10, 2022
- ASML NETHERLANDS B.V.
- Youping ZHANG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR DETERMINING CURVILINEAR PATTERNS FOR PATTERNING DEVICE
- Publication number 20210048753
- Publication date Feb 18, 2021
- ASML NETHERLANDS B.V.
- Quan ZHANG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHODS FOR TRAINING MACHINE LEARNING MODEL FOR COMPUTATION LITHOGR...
- Publication number 20200380362
- Publication date Dec 3, 2020
- ASML NETHERLANDS B.V.
- Yu CAO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TRAINING METHODS FOR MACHINE LEARNING ASSISTED OPTICAL PROXIMITY ER...
- Publication number 20200356011
- Publication date Nov 12, 2020
- ASML NETHERLANDS B.V.
- Jing SU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ASSIST FEATURE PLACEMENT BASED ON MACHINE LEARNING
- Publication number 20200050099
- Publication date Feb 13, 2020
- ASML NETHERLANDS B.V.
- Jing SU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IDENTIFICATION OF HOT SPOTS OR DEFECTS BY MACHINE LEARNING
- Publication number 20190147127
- Publication date May 16, 2019
- ASML NETHERLANDS B.V.
- Jing SU
- G06 - COMPUTING CALCULATING COUNTING

Person

Patents Grantslast 30 patents

Determining pattern ranking based on measurement feedback from prin...

Training methods for machine learning assisted optical proximity er...

Method for determining curvilinear patterns for patterning device

Determining pattern ranking based on measurement feedback from prin...

Training methods for machine learning assisted optical proximity er...

Identification of hot spots or defects by machine learning

Method for determining curvilinear patterns for patterning device

Coloring aware optimization

Patents Applicationslast 30 patents

TRAINING METHODS FOR MACHINE LEARNING ASSISTED OPTICAL PROXIMITY ER...

TRAINING METHODS FOR MACHINE LEARNING ASSISTED OPTICAL PROXIMITY ER...

METHODS FOR GENERATING CHARACTERISTIC PATTERN AND TRAINING MACHINE...

MODELING METHOD FOR COMPUTATIONAL FINGERPRINTS

IDENTIFICATION OF HOT SPOTS OR DEFECTS BY MACHINE LEARNING

METHOD FOR TRAINING MACHINE LEARNING MODEL TO DETERMINE OPTICAL PRO...

METHOD FOR DETERMINING CURVILINEAR PATTERNS FOR PATTERNING DEVICE

DETERMINING PATTERN RANKING BASED ON MEASUREMENT FEEDBACK FROM PRIN...

METHOD FOR DETERMINING CURVILINEAR PATTERNS FOR PATTERNING DEVICE

METHODS FOR TRAINING MACHINE LEARNING MODEL FOR COMPUTATION LITHOGR...

TRAINING METHODS FOR MACHINE LEARNING ASSISTED OPTICAL PROXIMITY ER...

ASSIST FEATURE PLACEMENT BASED ON MACHINE LEARNING

IDENTIFICATION OF HOT SPOTS OR DEFECTS BY MACHINE LEARNING