JING-YING YUE

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Beijing, CN

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Patents Grantslast 30 patents

Information Patent Grant
Device for imaging 1-D nanomaterials
- Patent number 11,549,890
- Issue date Jan 10, 2023
- Tsinghua University
- Wen-Yun Wu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and device for chirality assignment of carbon nanotube
- Patent number 10,267,738
- Issue date Apr 23, 2019
- Tsinghua University
- Wen-Yun Wu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and device for imaging 1-D nanomaterials
- Patent number 10,151,703
- Issue date Dec 11, 2018
- Tsinghua University
- Wen-Yun Wu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and device for chirality assignment of carbon nanotubes
- Patent number 10,088,421
- Issue date Oct 2, 2018
- Tsinghua University
- Wen-Yun Wu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEVICE FOR IMAGING 1-D NANOMATERIALS
- Publication number 20190025216
- Publication date Jan 24, 2019
- TSINGHUA UNIVERSITY
- Wen-Yun Wu
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD FOR IMAGING 1-D NANOMATERIALS
- Publication number 20160061664
- Publication date Mar 3, 2016
- TSINGHUA UNIVERSITY
- WEN-YUN WU
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR IMAGING 1-D NANOMATERIALS
- Publication number 20160061734
- Publication date Mar 3, 2016
- TSINGHUA UNIVERSITY
- WEN-YUN WU
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR CHIRALITY ASSIGNMENT OF CARBON NANOTUBE
- Publication number 20160061718
- Publication date Mar 3, 2016
- TSINGHUA UNIVERSITY
- WEN-YUN WU
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR CHIRALITY ASSIGNMENT OF CARBON NANOTUBES
- Publication number 20160061733
- Publication date Mar 3, 2016
- TSINGHUA UNIVERSITY
- WEN-YUN WU
- G01 - MEASURING TESTING