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Jing Zeng
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Austin, TX, US
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last 30 patents
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Patent Grant
Method and device for testing delay paths of an integrated circuit
Patent number
7,647,573
Issue date
Jan 12, 2010
FREESCALE SEMICONDUCTOR, INC.
Magdy S. Abadir
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Design analysis tool for path extraction and false path identificat...
Patent number
6,952,812
Issue date
Oct 4, 2005
FREESCALE SEMICONDUCTOR, INC.
Magdy S. Abadir
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
Method and device for testing delay paths of an integrated circuit
Publication number
20070277135
Publication date
Nov 29, 2007
FREESCALE SEMICONDUCTOR, INC.
Jing Zeng
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Design analysis tool for path extraction and false path identificat...
Publication number
20020112213
Publication date
Aug 15, 2002
Magdy S. Abadir
G01 - MEASURING TESTING