Jing Zhang

Person

Minneapolis, MN, US

People

Patents Grantslast 30 patents

Information Patent Grant
Mode selection and defect detection training
- Patent number 11,769,242
- Issue date Sep 26, 2023
- KLA Corporation
- Jing Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Abrasive article and method of grinding
- Patent number 11,724,364
- Issue date Aug 15, 2023
- 3M Innovative Properties Company
- Jaime A. Martinez
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Grant
Accelerated training of a machine learning based model for semicond...
- Patent number 11,580,375
- Issue date Feb 14, 2023
- KLA-Tencor Corp.
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Diagnostic systems and methods for deep learning models configured...
- Patent number 11,580,398
- Issue date Feb 14, 2023
- KLA-Tenor Corp.
- Jing Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Learnable defect detection for semiconductor applications
- Patent number 11,551,348
- Issue date Jan 10, 2023
- KLA Corp.
- Jing Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Open coat abrasive article and method of abrading
- Patent number 11,446,787
- Issue date Sep 20, 2022
- 3M Innovative Properties Company
- Jing Zhang
- B24 - GRINDING POLISHING
Information Patent Grant
Multi-controller inspection system
- Patent number 11,415,526
- Issue date Aug 16, 2022
- KLA Corporation
- Brian Duffy
- G01 - MEASURING TESTING
Information Patent Grant
Active learning for defect classifier training
- Patent number 10,713,769
- Issue date Jul 14, 2020
- KLA-Tencor Corp.
- Jing Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Generating high resolution images from low resolution images for se...
- Patent number 10,648,924
- Issue date May 12, 2020
- KLA-Tencor Corp.
- Jing Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for defect detection using image reconstruction
- Patent number 10,416,087
- Issue date Sep 17, 2019
- KLA-Tencor Corporation
- Jing Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Generating simulated images from input images for semiconductor app...
- Patent number 10,395,356
- Issue date Aug 27, 2019
- KLA-Tencor Corp.
- Jing Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Accelerating semiconductor-related computations using learning base...
- Patent number 10,360,477
- Issue date Jul 23, 2019
- KLA-Tencor Corp.
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Generating simulated output for a specimen
- Patent number 10,043,261
- Issue date Aug 7, 2018
- KLA-Tencor Corp.
- Kris Bhaskar
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Generating simulated images from design information
- Patent number 9,965,901
- Issue date May 8, 2018
- KLA-Tencor Corp.
- Jing Zhang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Hybrid inspectors
- Patent number 9,916,965
- Issue date Mar 13, 2018
- KLA-Tencor Corp.
- Kris Bhaskar
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SELECTIVE ETCHING OF SILICON-CONTAINING MATERIAL RELATIVE TO METAL-...
- Publication number 20240266185
- Publication date Aug 8, 2024
- Applied Materials, Inc.
- Han Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
UNSUPERVISED OR SELF-SUPERVISED DEEP LEARNING FOR SEMICONDUCTOR-BAS...
- Publication number 20240013365
- Publication date Jan 11, 2024
- KLA Corporation
- Jing Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF MAKING A COATED ABRASIVE ARTICLE AND COATED ABRASIVE ARTICLE
- Publication number 20230405766
- Publication date Dec 21, 2023
- 3M Innovative Properties Company
- Junting Li
- B24 - GRINDING POLISHING
Information Patent Application
RUTHENIUM CARBIDE FOR DRAM CAPACITOR MOLD PATTERNING
- Publication number 20230395391
- Publication date Dec 7, 2023
- Applied Materials, Inc.
- Han Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COATED ABRASIVE ARTICLE AND METHOD OF MAKING THE SAME
- Publication number 20230356362
- Publication date Nov 9, 2023
- 3M Innovative Properties Company
- Ernest L. Thurber
- B24 - GRINDING POLISHING
Information Patent Application
ABRASIVE ARTICLES AND METHOD OF MAKING THE SAME
- Publication number 20230286111
- Publication date Sep 14, 2023
- 3M Innovative Properties Company
- Yuyang Liu
- B24 - GRINDING POLISHING
Information Patent Application
ABRASIVE ARTICLE AND METHOD OF MAKING THE SAME
- Publication number 20230278170
- Publication date Sep 7, 2023
- 3M Innovative Properties Company
- Junting Li
- B24 - GRINDING POLISHING
Information Patent Application
UNSUPERVISED OR SELF-SUPERVISED DEEP LEARNING FOR SEMICONDUCTOR-BAS...
- Publication number 20230260100
- Publication date Aug 17, 2023
- KLA Corporation
- Jing Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
KNOWLEDGE DISTILLATION FOR SEMICONDUCTOR-BASED APPLICATIONS
- Publication number 20230136110
- Publication date May 4, 2023
- KLA Corporation
- Rajkumar Theagarajan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LEARNABLE DEFECT DETECTION FOR SEMICONDUCTOR APPLICATIONS
- Publication number 20230118839
- Publication date Apr 20, 2023
- KLA Corporation
- Jing Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ANTIBODIES THAT DISRUPT THE INTERACTION OF GAL3 AND INSULIN RECEPTO...
- Publication number 20230094463
- Publication date Mar 30, 2023
- TrueBinding, Inc.
- Dongxu Sun
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
ABRASIVE ARTICLE
- Publication number 20230001541
- Publication date Jan 5, 2023
- 3M Innovative Properties Company
- Junting Li
- B24 - GRINDING POLISHING
Information Patent Application
COATED ABRASIVE ARTICLES AND METHODS OF MAKING COATED ABRASIVE ARTI...
- Publication number 20230001544
- Publication date Jan 5, 2023
- 3M Innovative Properties Company
- Yuyang Liu
- B24 - GRINDING POLISHING
Information Patent Application
ABRASIVE ARTICLE
- Publication number 20220152783
- Publication date May 19, 2022
- 3M Innovative Properties Company
- Jaime A. Martinez
- B24 - GRINDING POLISHING
Information Patent Application
MODE SELECTION AND DEFECT DETECTION TRAINING
- Publication number 20210366103
- Publication date Nov 25, 2021
- KLA Corporation
- Jing Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTI-CONTROLLER INSPECTION SYSTEM
- Publication number 20210349038
- Publication date Nov 11, 2021
- KLA Corporation
- Brian Duffy
- G01 - MEASURING TESTING
Information Patent Application
LEARNABLE DEFECT DETECTION FOR SEMICONDUCTOR APPLICATIONS
- Publication number 20200327654
- Publication date Oct 15, 2020
- KLA Corporation
- Jing Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ABRASIVE ARTICLE AND METHOD OF GRINDING
- Publication number 20200070315
- Publication date Mar 5, 2020
- 3M Innovative Properties Company
- Jaime A. Martinez
- B24 - GRINDING POLISHING
Information Patent Application
ACTIVE LEARNING FOR DEFECT CLASSIFIER TRAINING
- Publication number 20190370955
- Publication date Dec 5, 2019
- KLA-Tencor Corporation
- Jing Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR CHAMBER COATINGS AND PROCESSES
- Publication number 20190304756
- Publication date Oct 3, 2019
- Applied Materials, Inc.
- Laksheswar Kalita
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
OPEN COAT ABRASIVE ARTICLE AND METHOD OF ABRADING
- Publication number 20190217444
- Publication date Jul 18, 2019
- 3M Innovative Properties Company
- Jing Zhang
- B24 - GRINDING POLISHING
Information Patent Application
DIAGNOSTIC SYSTEMS AND METHODS FOR DEEP LEARNING MODELS CONFIGURED...
- Publication number 20180107928
- Publication date Apr 19, 2018
- KLA-Tencor Corporation
- Jing Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS INCORPORATING A NEURAL NETWORK AND A FORWARD PH...
- Publication number 20170351952
- Publication date Dec 7, 2017
- KLA-Tencor Corporation
- Jing Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GENERATING SIMULATED IMAGES FROM INPUT IMAGES FOR SEMICONDUCTOR APP...
- Publication number 20170345140
- Publication date Nov 30, 2017
- KLA-Tencor Corporation
- Jing Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ACCELERATING SEMICONDUCTOR-RELATED COMPUTATIONS USING LEARNING BASE...
- Publication number 20170200260
- Publication date Jul 13, 2017
- KLA-Tencor Corporation
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GENERATING SIMULATED OUTPUT FOR A SPECIMEN
- Publication number 20170200265
- Publication date Jul 13, 2017
- KLA-Tencor Corporation
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GENERATING HIGH RESOLUTION IMAGES FROM LOW RESOLUTION IMAGES FOR SE...
- Publication number 20170193680
- Publication date Jul 6, 2017
- KLA-Tencor Corporation
- Jing Zhang
- G01 - MEASURING TESTING
Information Patent Application
HYBRID INSPECTORS
- Publication number 20170194126
- Publication date Jul 6, 2017
- KLA-Tencor Corporation
- Kris Bhaskar
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Defect Detection Using Image Reconstruction
- Publication number 20170191945
- Publication date Jul 6, 2017
- KLA-Tencor Corporation
- Jing Zhang
- G01 - MEASURING TESTING
Information Patent Application
ACCELERATED TRAINING OF A MACHINE LEARNING BASED MODEL FOR SEMICOND...
- Publication number 20170193400
- Publication date Jul 6, 2017
- KLA-Tencor Corporation
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING

Person

Patents Grantslast 30 patents

Mode selection and defect detection training

Abrasive article and method of grinding

Accelerated training of a machine learning based model for semicond...

Diagnostic systems and methods for deep learning models configured...

Learnable defect detection for semiconductor applications

Open coat abrasive article and method of abrading

Multi-controller inspection system

Active learning for defect classifier training

Generating high resolution images from low resolution images for se...

Systems and methods for defect detection using image reconstruction

Generating simulated images from input images for semiconductor app...

Accelerating semiconductor-related computations using learning base...

Generating simulated output for a specimen

Generating simulated images from design information

Hybrid inspectors

Patents Applicationslast 30 patents

SELECTIVE ETCHING OF SILICON-CONTAINING MATERIAL RELATIVE TO METAL-...

UNSUPERVISED OR SELF-SUPERVISED DEEP LEARNING FOR SEMICONDUCTOR-BAS...

METHOD OF MAKING A COATED ABRASIVE ARTICLE AND COATED ABRASIVE ARTICLE

RUTHENIUM CARBIDE FOR DRAM CAPACITOR MOLD PATTERNING

COATED ABRASIVE ARTICLE AND METHOD OF MAKING THE SAME

ABRASIVE ARTICLES AND METHOD OF MAKING THE SAME

ABRASIVE ARTICLE AND METHOD OF MAKING THE SAME

UNSUPERVISED OR SELF-SUPERVISED DEEP LEARNING FOR SEMICONDUCTOR-BAS...

KNOWLEDGE DISTILLATION FOR SEMICONDUCTOR-BASED APPLICATIONS

LEARNABLE DEFECT DETECTION FOR SEMICONDUCTOR APPLICATIONS

ANTIBODIES THAT DISRUPT THE INTERACTION OF GAL3 AND INSULIN RECEPTO...

ABRASIVE ARTICLE

COATED ABRASIVE ARTICLES AND METHODS OF MAKING COATED ABRASIVE ARTI...

ABRASIVE ARTICLE

MODE SELECTION AND DEFECT DETECTION TRAINING

MULTI-CONTROLLER INSPECTION SYSTEM

LEARNABLE DEFECT DETECTION FOR SEMICONDUCTOR APPLICATIONS

ABRASIVE ARTICLE AND METHOD OF GRINDING

ACTIVE LEARNING FOR DEFECT CLASSIFIER TRAINING

SEMICONDUCTOR CHAMBER COATINGS AND PROCESSES

OPEN COAT ABRASIVE ARTICLE AND METHOD OF ABRADING

DIAGNOSTIC SYSTEMS AND METHODS FOR DEEP LEARNING MODELS CONFIGURED...

SYSTEMS AND METHODS INCORPORATING A NEURAL NETWORK AND A FORWARD PH...

GENERATING SIMULATED IMAGES FROM INPUT IMAGES FOR SEMICONDUCTOR APP...

ACCELERATING SEMICONDUCTOR-RELATED COMPUTATIONS USING LEARNING BASE...

GENERATING SIMULATED OUTPUT FOR A SPECIMEN

GENERATING HIGH RESOLUTION IMAGES FROM LOW RESOLUTION IMAGES FOR SE...

HYBRID INSPECTORS

Systems and Methods for Defect Detection Using Image Reconstruction

ACCELERATED TRAINING OF A MACHINE LEARNING BASED MODEL FOR SEMICOND...