Jingjing Zhang

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Singapore, SG

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Patents Grantslast 30 patents

Information Patent Grant
Conductor coil defect identifier
- Patent number 7,271,598
- Issue date Sep 18, 2007
- Hitachi Global Storage Technologies Netherlands, B.V.
- Kelvin Kor Seng Ang
- G01 - MEASURING TESTING
Information Patent Grant
Quantative extraction of micro particles from metallic disk spacer...
- Patent number 7,239,121
- Issue date Jul 3, 2007
- Hitachi Global Storage Technologies Netherlands B.V.
- Shaoyong Liu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Quantative extraction of micro particles from metallic disk spacer...
- Publication number 20060202670
- Publication date Sep 14, 2006
- Shaoyong Liu
- G01 - MEASURING TESTING