Jingrui He

Person

Yorktown Heights, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Graph-based transfer learning
- Patent number 9,477,929
- Issue date Oct 25, 2016
- International Business Machines Corporation
- Jingrui He
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for wafer quality predictive modeling based on multi-source...
- Patent number 9,395,408
- Issue date Jul 19, 2016
- GLOBALFOUNDRIES Inc.
- Yada Zhu
- G01 - MEASURING TESTING
Information Patent Grant
Run-to-run control utilizing virtual metrology in semiconductor man...
- Patent number 9,299,623
- Issue date Mar 29, 2016
- International Business Machines Corporation
- Robert J. Baseman
- G05 - CONTROLLING REGULATING
Information Patent Grant
Run-to-run control utilizing virtual metrology in semiconductor man...
- Patent number 9,240,360
- Issue date Jan 19, 2016
- International Business Machines Corporation
- Robert Jeffrey Baseman
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and system for wafer quality predictive modeling based on mu...
- Patent number 9,176,183
- Issue date Nov 3, 2015
- GLOBALFOUNDRIES, INC.
- Yada Zhu
- G01 - MEASURING TESTING
Information Patent Grant
Finding a top-K diversified ranking list on graphs
- Patent number 9,009,147
- Issue date Apr 14, 2015
- International Business Machines Corporation
- Jingrui He
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Graph-based framework for multi-task multi-view learning
- Patent number 8,990,128
- Issue date Mar 24, 2015
- International Business Machines Corporation
- Jingrui He
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for hierarchical wafer quality predictive mode...
- Patent number 8,732,627
- Issue date May 20, 2014
- International Business Machines Corporation
- Robert J. Baseman
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
EXPLAINING OUTLIERS IN TIME SERIES AND EVALUATING ANOMALY DETECTION...
- Publication number 20220253426
- Publication date Aug 11, 2022
- International Business Machines Corporation
- Yada Zhu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and System for Wafer Quality Predictive Modeling based on Mu...
- Publication number 20140107828
- Publication date Apr 17, 2014
- International Business Machines Corporation
- Yada Zhu
- G01 - MEASURING TESTING
Information Patent Application
Method and System for Wafer Quality Predictive Modeling based on Mu...
- Publication number 20140107824
- Publication date Apr 17, 2014
- International Business Machines Corporation
- Yada Zhu
- G01 - MEASURING TESTING
Information Patent Application
Run-to-Run Control Utilizing Virtual Metrology in Semiconductor Man...
- Publication number 20140031969
- Publication date Jan 30, 2014
- International Business Machines Corporation
- Robert J. Baseman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Run-to-Run Control Utilizing Virtual Metrology in Semiconductor Man...
- Publication number 20140031968
- Publication date Jan 30, 2014
- International Business Machines Corporation
- Robert Jeffrey Baseman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and Apparatus for Hierarchical Wafer Quality Predictive Mode...
- Publication number 20130339919
- Publication date Dec 19, 2013
- International Business Machines Corporation
- Robert J. Baseman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and Apparatus for Hierarchical Wafer Quality Predictive Mode...
- Publication number 20130338808
- Publication date Dec 19, 2013
- International Business Machines Corporation
- Robert J. Baseman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GRAPH-BASED FRAMEWORK FOR MULTI-TASK MULTI-VIEW LEARNING
- Publication number 20130325756
- Publication date Dec 5, 2013
- International Business Machines Corporation
- Jingrui He
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FINDING A TOP-K DIVERSIFIED RANKING LIST ON GRAPHS
- Publication number 20130046768
- Publication date Feb 21, 2013
- International Business Machines Corporation
- Jingrui He
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASURING THE GOODNESS OF A TOP-K DIVERSIFIED RANKING LIST
- Publication number 20130046769
- Publication date Feb 21, 2013
- International Business Machines Corporation
- Jingrui He
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR AUTOMATED LABELING OF TEXT DOCUMENTS USING ON...
- Publication number 20130018828
- Publication date Jan 17, 2013
- International Business Machines Corporation
- Jingrui He
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR AUTOMATED LABELING OF TEXT DOCUMENTS USING ON...
- Publication number 20130018827
- Publication date Jan 17, 2013
- International Business Machines Corporation
- Jingrui He
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GRAPH-BASED TRANSFER LEARNING
- Publication number 20130013540
- Publication date Jan 10, 2013
- International Business Machines Corporation
- Jingrui He
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Graph-based transfer learning
- Publication number 20110320387
- Publication date Dec 29, 2011
- International Business Machines Corporation
- Jingrui He
- G06 - COMPUTING CALCULATING COUNTING

Person

Patents Grantslast 30 patents

Graph-based transfer learning

System for wafer quality predictive modeling based on multi-source...

Run-to-run control utilizing virtual metrology in semiconductor man...

Run-to-run control utilizing virtual metrology in semiconductor man...

Method and system for wafer quality predictive modeling based on mu...

Finding a top-K diversified ranking list on graphs

Graph-based framework for multi-task multi-view learning

Method and apparatus for hierarchical wafer quality predictive mode...

Patents Applicationslast 30 patents

EXPLAINING OUTLIERS IN TIME SERIES AND EVALUATING ANOMALY DETECTION...

Method and System for Wafer Quality Predictive Modeling based on Mu...

Method and System for Wafer Quality Predictive Modeling based on Mu...

Run-to-Run Control Utilizing Virtual Metrology in Semiconductor Man...

Run-to-Run Control Utilizing Virtual Metrology in Semiconductor Man...

Method and Apparatus for Hierarchical Wafer Quality Predictive Mode...

Method and Apparatus for Hierarchical Wafer Quality Predictive Mode...

GRAPH-BASED FRAMEWORK FOR MULTI-TASK MULTI-VIEW LEARNING

FINDING A TOP-K DIVERSIFIED RANKING LIST ON GRAPHS

MEASURING THE GOODNESS OF A TOP-K DIVERSIFIED RANKING LIST

SYSTEM AND METHOD FOR AUTOMATED LABELING OF TEXT DOCUMENTS USING ON...

SYSTEM AND METHOD FOR AUTOMATED LABELING OF TEXT DOCUMENTS USING ON...

GRAPH-BASED TRANSFER LEARNING

Graph-based transfer learning