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Jingsheng SHI
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Singapore, SG
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last 30 patents
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Patent Grant
Measurements of structures in presence of signal contaminations
Patent number
12,092,962
Issue date
Sep 17, 2024
Onto Innovation Inc.
Jingsheng Shi
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
Information
Patent Application
COMPOSITE DATA FOR DEVICE METROLOGY
Publication number
20240111256
Publication date
Apr 4, 2024
ONTO INNOVATION INC.
Haodong Qiu
G01 - MEASURING TESTING
Information
Patent Application
MITIGATION OF UNDESIRED SPECTRAL EFFECTS IN OPTICAL METROLOGY
Publication number
20240011921
Publication date
Jan 11, 2024
ONTO INNOVATION INC.
Petar Zuvela
G01 - MEASURING TESTING
Information
Patent Application
MULTIPLE SOURCES OF SIGNALS FOR HYBRID METROLOGY USING PHYSICAL MOD...
Publication number
20230418995
Publication date
Dec 28, 2023
ONTO INNOVATION INC.
Jie Li
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METROLOGY SOLUTIONS FOR COMPLEX STRUCTURES OF INTEREST
Publication number
20230417682
Publication date
Dec 28, 2023
ONTO INNOVATION INC.
Jingsheng SHI
G06 - COMPUTING CALCULATING COUNTING