Jingwei Cheng

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Shanghai, CN

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Patents Grantslast 30 patents

Information Patent Grant
Testing circuit for a memory device
- Patent number 12,142,332
- Issue date Nov 12, 2024
- Micron Technology, Inc.
- Chunqiang Weng
- G11 - INFORMATION STORAGE
Information Patent Grant
Configurable memory die capacitance
- Patent number 11,947,813
- Issue date Apr 2, 2024
- Micron Technology, Inc.
- Jingwei Cheng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Debug capabilities of a memory system with a pin
- Patent number 11,923,023
- Issue date Mar 5, 2024
- Micron Technology, Inc.
- Jingwei Cheng
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
CONFIGURABLE MEMORY DIE CAPACITANCE
- Publication number 20240295975
- Publication date Sep 5, 2024
- Micron Technology, Inc.
- Jingwei Cheng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEBUG CAPABILITIES OF A MEMORY SYSTEM WITH A PIN
- Publication number 20230207035
- Publication date Jun 29, 2023
- Micron Technology, Inc.
- Jingwei Cheng
- G11 - INFORMATION STORAGE
Information Patent Application
CONFIGURABLE MEMORY DIE CAPACITANCE
- Publication number 20230118874
- Publication date Apr 20, 2023
- Micron Technology, Inc.
- Jingwei Cheng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TESTING CIRCUIT FOR A MEMORY DEVICE
- Publication number 20230077784
- Publication date Mar 16, 2023
- Micron Technology, Inc.
- Chunqiang Weng
- G11 - INFORMATION STORAGE