Jingzhou XU

Person

Ann Arbor, MI, US

People

Patents Grantslast 30 patents

Information Patent Grant
Multi-pulse amplification
- Patent number 11,201,447
- Issue date Dec 14, 2021
- IMRA America, Inc.
- Jingzhou Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Controllable multi-wavelength laser source
- Patent number 9,407,056
- Issue date Aug 2, 2016
- IMRA AMERICA, INC.
- Jingzhou Xu
- G02 - OPTICS
Information Patent Grant
Laser-based material processing apparatus and methods
- Patent number 9,321,126
- Issue date Apr 26, 2016
- IMRA America, Inc.
- Jingzhou Xu
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Optical pulse source with increased peak power
- Patent number 9,240,670
- Issue date Jan 19, 2016
- IMRA America, Inc.
- Jingzhou Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transparent material processing with an ultrashort pulse laser
- Patent number 9,138,913
- Issue date Sep 22, 2015
- IMRA America, Inc.
- Alan Y. Arai
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Controllable multi-wavelength laser source
- Patent number 8,976,823
- Issue date Mar 10, 2015
- IMRA America, Inc.
- Jingzhou Xu
- G02 - OPTICS
Information Patent Grant
Methods and systems for laser processing of coated substrates
- Patent number 8,969,220
- Issue date Mar 3, 2015
- IMRA America, Inc.
- Alan Y. Arai
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Methods and systems for fiber delivery of high peak power
- Patent number 8,848,748
- Issue date Sep 30, 2014
- IMRA America, Inc.
- Gyu Cho
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Terahertz radiation source mounting arrangements and methods of mou...
- Patent number 8,796,653
- Issue date Aug 5, 2014
- Rensselaer Polytechnic Institute
- Brian Schulkin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser-based material processing methods and systems
- Patent number 8,785,813
- Issue date Jul 22, 2014
- IMRA America, Inc.
- Lawrence Shah
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Pulsed laser micro-deposition pattern formation
- Patent number 8,663,754
- Issue date Mar 4, 2014
- IMRA America, Inc.
- Bing Liu
- B44 - DECORATIVE ARTS
Information Patent Grant
Laser-based material processing methods and systems
- Patent number 8,158,493
- Issue date Apr 17, 2012
- IMRA America, Inc.
- Lawrence Shah
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Beam scanning imaging method and apparatus
- Patent number 7,897,924
- Issue date Mar 1, 2011
- IMRA America, Inc.
- Jingzhou Xu
- G01 - MEASURING TESTING
Information Patent Grant
Systems, methods, and devices for handling terahertz radiation
- Patent number 7,808,636
- Issue date Oct 5, 2010
- Rensselaer Polytechnic Institute
- Brian Schulkin
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for imaging an object using multiple distinguisha...
- Patent number 7,557,348
- Issue date Jul 7, 2009
- Rensselaer Polytechnic Institute
- Jingzhou Xu
- G01 - MEASURING TESTING
Information Patent Grant
GaSe crystals for broadband terahertz wave detection
- Patent number 7,242,010
- Issue date Jul 10, 2007
- Rensselaer Polytechnic Institute
- Kai Liu
- G01 - MEASURING TESTING
Information Patent Grant
High repetition rate, linear, true time optical delay line
- Patent number 7,239,775
- Issue date Jul 3, 2007
- Rensselaer Polytechnic Institute
- Jingzhou Xu
- G02 - OPTICS
Information Patent Grant
Field induced THz wave emission microscope
- Patent number 7,230,245
- Issue date Jun 12, 2007
- Rensselaer Polytechnic Institute
- Xi-Cheng Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor surface-field emitter for T-ray generation
- Patent number 7,091,506
- Issue date Aug 15, 2006
- Xi-Cheng Zhang
- G01 - MEASURING TESTING
Information Patent Grant
T-ray Microscope
- Patent number 6,977,379
- Issue date Dec 20, 2005
- Rensselaer Polytechnic Institute
- Xi-Cheng Zhang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MULTI-PULSE AMPLIFICATION
- Publication number 20200127431
- Publication date Apr 23, 2020
- IMRA America, Inc.
- Jingzhou Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL PULSE SOURCE WITH INCREASED PEAK POWER
- Publication number 20160099541
- Publication date Apr 7, 2016
- IMRA America, Inc.
- Jingzhou XU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRANSPARENT MATERIAL PROCESSING WITH AN ULTRASHORT PULSE LASER
- Publication number 20160067822
- Publication date Mar 10, 2016
- IMRA America, Inc.
- Alan Y. ARAI
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
CONTROLLABLE MULTI-WAVELENGTH LASER SOURCE
- Publication number 20150180194
- Publication date Jun 25, 2015
- IMRA America, Inc.
- Jingzhou XU
- G02 - OPTICS
Information Patent Application
METHODS AND SYSTEMS FOR LASER PROCESSING OF COATED SUBSTRATES
- Publication number 20150136744
- Publication date May 21, 2015
- IMRA America, Inc.
- Alan Y. Arai
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
LASER-BASED MATERIAL PROCESSING METHODS AND SYSTEMS
- Publication number 20140312469
- Publication date Oct 23, 2014
- Lawrence Shah
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
TERAHERTZ RADIATION SOURCE MOUNTING ARRANGEMENTS AND METHODS OF MOU...
- Publication number 20140306128
- Publication date Oct 16, 2014
- Rensselaer Polytechnic Institute
- Brian SCHULKIN
- G01 - MEASURING TESTING
Information Patent Application
PULSED LASER MICRO-DEPOSITION PATTERN FORMATION
- Publication number 20140161998
- Publication date Jun 12, 2014
- IMRA America, Inc.
- Bing Liu
- B44 - DECORATIVE ARTS
Information Patent Application
METHODS AND SYSTEMS FOR LASER PROCESSING OF COATED SUBSTRATES
- Publication number 20130183837
- Publication date Jul 18, 2013
- IMRA America, Inc.
- Alan Y. Arai
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
CONTROLLABLE MULTI-WAVELENGTH LASER SOURCE
- Publication number 20130064256
- Publication date Mar 14, 2013
- IMRA America, Inc.
- Jingzhou XU
- G02 - OPTICS
Information Patent Application
OPTICAL PULSE SOURCE WITH INCREASED PEAK POWER
- Publication number 20120230353
- Publication date Sep 13, 2012
- IMRA America, Inc.
- Jingzhou XU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LASER-BASED MATERIAL PROCESSING METHODS AND SYSTEMS
- Publication number 20120196454
- Publication date Aug 2, 2012
- IMRA America, Inc.
- Lawrence Shah
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
METHODS AND SYSTEMS FOR FIBER DELIVERY OF HIGH PEAK POWER OPTICAL P...
- Publication number 20120195330
- Publication date Aug 2, 2012
- IMRA America, Inc.
- Gyu Cheon CHO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LASER-BASED MATERIAL PROCESSING APPARATUS AND METHODS
- Publication number 20110240617
- Publication date Oct 6, 2011
- IMRA America, Inc.
- Jingzhou Xu
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
TERAHERTZ RADIATION SOURCE MOUNTING ARRANGEMENTS AND METHODS OF MOU...
- Publication number 20110006226
- Publication date Jan 13, 2011
- Rensselaer Polytechnic Institute
- Brian SCHULKIN
- G01 - MEASURING TESTING
Information Patent Application
PULSED LASER MICRO-DEPOSITION PATTERN FORMATION
- Publication number 20100227133
- Publication date Sep 9, 2010
- IMRA America, Inc.
- Bing Liu
- B44 - DECORATIVE ARTS
Information Patent Application
LASER-BASED MATERIAL PROCESSING METHODS AND SYSTEMS
- Publication number 20100197116
- Publication date Aug 5, 2010
- IMRA America, Inc.
- Lawrence Shah
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
TRANSPARENT MATERIAL PROCESSING WITH AN ULTRASHORT PULSE LASER
- Publication number 20100025387
- Publication date Feb 4, 2010
- IMRA America, Inc.
- Alan Y. Arai
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
BEAM SCANNING IMAGING METHOD AND APPARATUS
- Publication number 20080251720
- Publication date Oct 16, 2008
- IMRA America, Inc.
- Jingzhou XU
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS, METHODS, AND DEVICES FOR HANDLING TERAHERTZ RADIATION
- Publication number 20080239317
- Publication date Oct 2, 2008
- Rensselaer Polytechnic Institute
- Brian SCHULKIN
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR IMAGING AN OBJECT USING MULTIPLE DISTINGUISHA...
- Publication number 20080179526
- Publication date Jul 31, 2008
- Rensselaer Polytechnic Institute
- Jingzhou XU
- G01 - MEASURING TESTING
Information Patent Application
High repetition rate, linear, true time optical delay line
- Publication number 20070009207
- Publication date Jan 11, 2007
- Jingzhou Xu
- G02 - OPTICS
Information Patent Application
GaSe crystals for broadband terahertz wave detection
- Publication number 20060214114
- Publication date Sep 28, 2006
- Kai Liu
- G01 - MEASURING TESTING
Information Patent Application
Field induced THz wave emission microscope
- Publication number 20060022141
- Publication date Feb 2, 2006
- Xi-Cheng Zhang
- G01 - MEASURING TESTING
Information Patent Application
T-RAY MICROSCOPE
- Publication number 20050230625
- Publication date Oct 20, 2005
- Xi-Cheng Zhang
- G02 - OPTICS
Information Patent Application
Semiconductor surface-field emitter for T-ray generation
- Publication number 20040262544
- Publication date Dec 30, 2004
- Xi-Cheng Zhang
- G02 - OPTICS

Jingzhou XU

Person

Patents Grantslast 30 patents

Multi-pulse amplification

Controllable multi-wavelength laser source

Laser-based material processing apparatus and methods

Optical pulse source with increased peak power

Transparent material processing with an ultrashort pulse laser

Controllable multi-wavelength laser source

Methods and systems for laser processing of coated substrates

Methods and systems for fiber delivery of high peak power

Terahertz radiation source mounting arrangements and methods of mou...

Laser-based material processing methods and systems

Pulsed laser micro-deposition pattern formation

Laser-based material processing methods and systems

Beam scanning imaging method and apparatus

Systems, methods, and devices for handling terahertz radiation

Method and system for imaging an object using multiple distinguisha...

GaSe crystals for broadband terahertz wave detection

High repetition rate, linear, true time optical delay line

Field induced THz wave emission microscope

Semiconductor surface-field emitter for T-ray generation

T-ray Microscope

Patents Applicationslast 30 patents

MULTI-PULSE AMPLIFICATION

OPTICAL PULSE SOURCE WITH INCREASED PEAK POWER

TRANSPARENT MATERIAL PROCESSING WITH AN ULTRASHORT PULSE LASER

CONTROLLABLE MULTI-WAVELENGTH LASER SOURCE

METHODS AND SYSTEMS FOR LASER PROCESSING OF COATED SUBSTRATES

LASER-BASED MATERIAL PROCESSING METHODS AND SYSTEMS

TERAHERTZ RADIATION SOURCE MOUNTING ARRANGEMENTS AND METHODS OF MOU...

PULSED LASER MICRO-DEPOSITION PATTERN FORMATION

METHODS AND SYSTEMS FOR LASER PROCESSING OF COATED SUBSTRATES

CONTROLLABLE MULTI-WAVELENGTH LASER SOURCE

OPTICAL PULSE SOURCE WITH INCREASED PEAK POWER

LASER-BASED MATERIAL PROCESSING METHODS AND SYSTEMS

METHODS AND SYSTEMS FOR FIBER DELIVERY OF HIGH PEAK POWER OPTICAL P...

LASER-BASED MATERIAL PROCESSING APPARATUS AND METHODS

TERAHERTZ RADIATION SOURCE MOUNTING ARRANGEMENTS AND METHODS OF MOU...

PULSED LASER MICRO-DEPOSITION PATTERN FORMATION

LASER-BASED MATERIAL PROCESSING METHODS AND SYSTEMS

TRANSPARENT MATERIAL PROCESSING WITH AN ULTRASHORT PULSE LASER

BEAM SCANNING IMAGING METHOD AND APPARATUS

SYSTEMS, METHODS, AND DEVICES FOR HANDLING TERAHERTZ RADIATION

METHOD AND SYSTEM FOR IMAGING AN OBJECT USING MULTIPLE DISTINGUISHA...

High repetition rate, linear, true time optical delay line

GaSe crystals for broadband terahertz wave detection

Field induced THz wave emission microscope

T-RAY MICROSCOPE

Semiconductor surface-field emitter for T-ray generation