Jinhyuk CHOI

Person

Gyeonggi-do, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus with vanishing point estimation
- Patent number 12,148,177
- Issue date Nov 19, 2024
- Samsung Electronics Co., Ltd.
- Byeongju Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electronic device and method for diagnosing battery thereof
- Patent number 11,994,562
- Issue date May 28, 2024
- Samsung Electronics Co., Ltd.
- Sengtai Lee
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for controlling charging on basis of battery char...
- Patent number 11,933,851
- Issue date Mar 19, 2024
- Samsung Electronics Co., Ltd.
- Yonghwan Hyun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer processing apparatus including equipment front end module (EF...
- Patent number 11,804,393
- Issue date Oct 31, 2023
- Samsung Electronics Co., Ltd.
- Jinhyuk Choi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Processors configured to detect objects and methods of detecting ob...
- Patent number 11,756,314
- Issue date Sep 12, 2023
- Samsung Electronics Co., Ltd.
- Jinhyuk Choi
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Vanishing point extraction devices and methods of extracting vanish...
- Patent number 11,557,052
- Issue date Jan 17, 2023
- Samsung Electronics Co., Ltd.
- Jinhyuk Choi
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS WITH TARGET DISTANCE ESTIMATION
- Publication number 20250014199
- Publication date Jan 9, 2025
- Samsung Electronics Co., Ltd.
- Woo Jung PARK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASURING APPARATUS FOR SEMICONDUCTOR DEVICE AND MEASURING METHOD U...
- Publication number 20240353484
- Publication date Oct 24, 2024
- Samsung Electronics Co., Ltd.
- Jinhyuk Choi
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR PROCESSING DEVICE AND SEMICONDUCTOR PROCESSING SYSTEM
- Publication number 20240178025
- Publication date May 30, 2024
- Samsung Electronics Co., Ltd.
- Hyunwoong Choi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND DEVICE WITH LANE DETECTION
- Publication number 20240142241
- Publication date May 2, 2024
- Samsung Electronics Co., Ltd.
- Jinhyuk CHOI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER TRANSFER APPARATUS CAPABLE OF AUTOMATIC TEACHING AND SEMICOND...
- Publication number 20240021452
- Publication date Jan 18, 2024
- Samsung Electronics Co., Ltd.
- Beomsoo Hwang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR SUBSTRATE PROCESSING APPARATUS
- Publication number 20230230865
- Publication date Jul 20, 2023
- Samsung Electronics Co., Ltd.
- Jinhyuk CHOI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS WITH DRIVING CONTROL
- Publication number 20230211778
- Publication date Jul 6, 2023
- Samsung Electronics Co., Ltd.
- TAE SOO KIM
- B60 - VEHICLES IN GENERAL
Information Patent Application
LOADLOCK APPARATUS AND SUBSTRATE PROCESSING APPARATUS INCLUDING THE...
- Publication number 20230097418
- Publication date Mar 30, 2023
- Samsung Electronics Co., Ltd.
- Jinhyuk CHOI
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
WAFER PROCESSING APPARATUS INCLUDING EFEM AND METHOD OF PROCESSING...
- Publication number 20230080991
- Publication date Mar 16, 2023
- Samsung Electronics Co., Ltd.
- Jinhyuk Choi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER PROCESSING APPARATUS INCLUDING EQUIPMENT FRONT END MODULE (EF...
- Publication number 20230072147
- Publication date Mar 9, 2023
- Samsung Electronics Co., Ltd.
- Jinhyuk Choi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD WITH OBJECT DETECTION
- Publication number 20230048497
- Publication date Feb 16, 2023
- Samsung Electronics Co., Ltd.
- Jinhyuk CHOI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS WITH VANISHING POINT ESTIMATION
- Publication number 20220383529
- Publication date Dec 1, 2022
- Samsung Electronics Co., Ltd.
- ByeongJu LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRONIC DEVICE AND METHOD FOR DIAGNOSING BATTERY THEREOF
- Publication number 20220026494
- Publication date Jan 27, 2022
- Samsung Electronics Co., LTD
- Sengtai LEE
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE PROCESSING APPARATUS
- Publication number 20210384012
- Publication date Dec 9, 2021
- Samsung Electronics Co., Ltd.
- Jinhyuk CHOI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROCESSORS CONFIGURED TO DETECT OBJECTS AND METHODS OF DETECTING OB...
- Publication number 20210279482
- Publication date Sep 9, 2021
- Samsung Electronics Co., Ltd.
- Jinhyuk CHOI
- B60 - VEHICLES IN GENERAL
Information Patent Application
VANISHING POINT EXTRACTION DEVICES AND METHODS OF EXTRACTING VANISH...
- Publication number 20210256720
- Publication date Aug 19, 2021
- Samsung Electronics Co., Ltd.
- Jinhyuk CHOI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEVICE AND METHOD FOR CONTROLLING CHARGING ON BASIS OF BATTERY CHAR...
- Publication number 20210048479
- Publication date Feb 18, 2021
- Samsung Electronics Co., Ltd.
- Yonghwan HYUN
- G01 - MEASURING TESTING
Information Patent Application
Plasma Processing Apparatus and Method of Manufacturing Semiconduct...
- Publication number 20190198296
- Publication date Jun 27, 2019
- Samsung Electronics Co., Ltd.
- SIQING LU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBSTRATE PROCESSING APPARATUS
- Publication number 20160155616
- Publication date Jun 2, 2016
- Samsung Electronics Co., Ltd.
- Suho LEE
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Jinhyuk CHOI

Person

Patents Grantslast 30 patents

Method and apparatus with vanishing point estimation

Electronic device and method for diagnosing battery thereof

Device and method for controlling charging on basis of battery char...

Wafer processing apparatus including equipment front end module (EF...

Processors configured to detect objects and methods of detecting ob...

Vanishing point extraction devices and methods of extracting vanish...

Patents Applicationslast 30 patents

METHOD AND APPARATUS WITH TARGET DISTANCE ESTIMATION

MEASURING APPARATUS FOR SEMICONDUCTOR DEVICE AND MEASURING METHOD U...

SEMICONDUCTOR PROCESSING DEVICE AND SEMICONDUCTOR PROCESSING SYSTEM

METHOD AND DEVICE WITH LANE DETECTION

WAFER TRANSFER APPARATUS CAPABLE OF AUTOMATIC TEACHING AND SEMICOND...

SEMICONDUCTOR SUBSTRATE PROCESSING APPARATUS

METHOD AND APPARATUS WITH DRIVING CONTROL

LOADLOCK APPARATUS AND SUBSTRATE PROCESSING APPARATUS INCLUDING THE...

WAFER PROCESSING APPARATUS INCLUDING EFEM AND METHOD OF PROCESSING...

WAFER PROCESSING APPARATUS INCLUDING EQUIPMENT FRONT END MODULE (EF...

APPARATUS AND METHOD WITH OBJECT DETECTION

METHOD AND APPARATUS WITH VANISHING POINT ESTIMATION

ELECTRONIC DEVICE AND METHOD FOR DIAGNOSING BATTERY THEREOF

SUBSTRATE PROCESSING APPARATUS

PROCESSORS CONFIGURED TO DETECT OBJECTS AND METHODS OF DETECTING OB...

VANISHING POINT EXTRACTION DEVICES AND METHODS OF EXTRACTING VANISH...

DEVICE AND METHOD FOR CONTROLLING CHARGING ON BASIS OF BATTERY CHAR...

Plasma Processing Apparatus and Method of Manufacturing Semiconduct...

SUBSTRATE PROCESSING APPARATUS