Jinjian Ouyang

Person

Fujian, CN

People

Patents Grantslast 30 patents

Information Patent Grant
Method for making semiconductor device using a stress memorization...
- Patent number 12,191,211
- Issue date Jan 7, 2025
- United Semiconductor (Xiamen) Co., Ltd.
- Linshan Yuan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Resistive random access memory and method of forming the same
- Patent number 11,737,381
- Issue date Aug 22, 2023
- United Semiconductor (Xiamen) Co., Ltd.
- Dejin Kong
Information Patent Grant
Semiconductor testkey pattern and test method thereof
- Patent number 11,721,599
- Issue date Aug 8, 2023
- United Semiconductor (Xiamen) Co., Ltd.
- Linshan Yuan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Radiofrequency device
- Patent number 11,380,627
- Issue date Jul 5, 2022
- United Semiconductor (Xiamen) Co., Ltd.
- Hui Feng Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
RRAM structure and method of fabricating the same
- Patent number 11,049,904
- Issue date Jun 29, 2021
- United Semiconductor (Xiamen) Co., Ltd.
- Chin-Chun Huang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Manufacturing method of semiconductor structure
- Publication number 20240304498
- Publication date Sep 12, 2024
- United Semiconductor (Xiamen) Co., Ltd.
- RUI JU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Device and Method of Fabricating the Same
- Publication number 20240222472
- Publication date Jul 4, 2024
- United Semiconductor (Xiamen) Co., Ltd.
- Chin-Chun Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TESTKEY STRUCTURE AND MONITORING METHOD WITH TESTKEY STRUCTURE
- Publication number 20230402329
- Publication date Dec 14, 2023
- United Semiconductor (Xiamen) Co., Ltd.
- Hang Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MAKING SEMICONDUCTOR DEVICE
- Publication number 20230352347
- Publication date Nov 2, 2023
- United Semiconductor (Xiamen) Co., Ltd.
- LINSHAN YUAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RESISTIVE RANDOM ACCESS MEMORY AND METHOD OF FORMING THE SAME
- Publication number 20230345848
- Publication date Oct 26, 2023
- United Semiconductor (Xiamen) Co., Ltd.
- DEJIN KONG
Information Patent Application
Semiconductor testkey and test method thereof
- Publication number 20230260857
- Publication date Aug 17, 2023
- United Semiconductor (Xiamen) Co., Ltd.
- LINSHAN YUAN
- G01 - MEASURING TESTING
Information Patent Application
RESISTIVE RANDOM ACCESS MEMORY AND METHOD OF FORMING THE SAME
- Publication number 20220336740
- Publication date Oct 20, 2022
- United Semiconductor (Xiamen) Co., Ltd.
- DEJIN KONG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor testkey pattern and test method thereof
- Publication number 20220285235
- Publication date Sep 8, 2022
- United Semiconductor (Xiamen) Co., Ltd.
- LINSHAN YUAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FORMING A SEMICONDUCTOR DEVICE
- Publication number 20220068723
- Publication date Mar 3, 2022
- United Semiconductor (Xiamen) Co., Ltd.
- TAO HU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RRAM STRUCTURE AND METHOD OF FABRICATING THE SAME
- Publication number 20210202578
- Publication date Jul 1, 2021
- United Semiconductor (Xiamen) Co., Ltd.
- Chin-Chun Huang
- H01 - BASIC ELECTRIC ELEMENTS

Jinjian Ouyang

Person

Patents Grantslast 30 patents

Method for making semiconductor device using a stress memorization...

Resistive random access memory and method of forming the same

Semiconductor testkey pattern and test method thereof

Radiofrequency device

RRAM structure and method of fabricating the same

Patents Applicationslast 30 patents

Manufacturing method of semiconductor structure

Semiconductor Device and Method of Fabricating the Same

TESTKEY STRUCTURE AND MONITORING METHOD WITH TESTKEY STRUCTURE

METHOD FOR MAKING SEMICONDUCTOR DEVICE

RESISTIVE RANDOM ACCESS MEMORY AND METHOD OF FORMING THE SAME

Semiconductor testkey and test method thereof

RESISTIVE RANDOM ACCESS MEMORY AND METHOD OF FORMING THE SAME

Semiconductor testkey pattern and test method thereof

METHOD FOR FORMING A SEMICONDUCTOR DEVICE

RRAM STRUCTURE AND METHOD OF FABRICATING THE SAME