-
-
-
-
-
-
-
-
-
-
SMART EDGE DETECTOR
-
Publication number 20120280718
-
Publication date Nov 8, 2012
-
Taiwan Semiconductor Manufacturing Company, Ltd.
-
Shu-Chun YANG
-
H04 - ELECTRIC COMMUNICATION TECHNIQUE
-
POWER SUPPLY REGULATOR
-
Publication number 20120229198
-
Publication date Sep 13, 2012
-
Taiwan Semiconductor Manufacturing Company, Ltd.
-
Chen-Ting Ko
-
G05 - CONTROLLING REGULATING
-
OUTPUT DRIVER
-
Publication number 20120212866
-
Publication date Aug 23, 2012
-
Taiwan Semiconductor Manufacturing Company, Ltd.
-
Chen-Ting KO
-
H03 - BASIC ELECTRONIC CIRCUITRY
-
BUILT IN SELF TEST FOR TRANSCEIVER
-
Publication number 20120169361
-
Publication date Jul 5, 2012
-
Taiwan Semiconductor Manufacturing Co., LTD
-
Jinn-Yeh CHIEN
-
G01 - MEASURING TESTING
-
Built-in Bit Error Rate Test Circuit
-
Publication number 20120066559
-
Publication date Mar 15, 2012
-
Taiwan Semiconductor Manufacturing Company, Ltd.
-
Jinn-Yeh Chien
-
G11 - INFORMATION STORAGE
-
SMART EDGE DETECTOR
-
Publication number 20110199121
-
Publication date Aug 18, 2011
-
Taiwan Semiconductor Manufacturing Company, Ltd.
-
Shu-Chun YANG
-
H04 - ELECTRIC COMMUNICATION TECHNIQUE
-
-
-
FAST LOCKING CLOCK AND DATA RECOVERY
-
Publication number 20090279655
-
Publication date Nov 12, 2009
-
Taiwan Semiconductor Manufacturing Co., Ltd.
-
Jinn-Yeh Chien
-
H04 - ELECTRIC COMMUNICATION TECHNIQUE
-
On-chip test apparatus
-
Publication number 20050193296
-
Publication date Sep 1, 2005
-
Taiwan Semiconductor Manufacturing Co., Ltd.
-
Jinn-Yeh Chien
-
G01 - MEASURING TESTING
-