Jinn-Yeh Chien

Person

  • Chu Bei, TW

Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    INTEGRATED CIRCUIT AND METHOD OF TESTING

    • Publication number 20200321953
    • Publication date Oct 8, 2020
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Jinn-Yeh CHIEN
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    INTEGRATED CIRCUIT AND METHOD OF TESTING

    • Publication number 20170366177
    • Publication date Dec 21, 2017
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Jinn-Yeh CHIEN
    • G01 - MEASURING TESTING
  • Information Patent Application

    DCO Phase Noise With PVT-Insensitive Calibration Circuit in ADPLL A...

    • Publication number 20170070231
    • Publication date Mar 9, 2017
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Feng Wei KUO
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    DEVICE TESTING AND MONITORING METHOD THEREOF

    • Publication number 20160146881
    • Publication date May 26, 2016
    • Taiwan Semiconductor Manufacturing company Ltd.
    • JAW-JUINN HORNG
    • G01 - MEASURING TESTING
  • Information Patent Application

    INTEGRATED CIRCUIT AND METHOD OF TESTING

    • Publication number 20160091560
    • Publication date Mar 31, 2016
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Jinn-Yeh CHIEN
    • G01 - MEASURING TESTING
  • Information Patent Application

    SYSTEM AND METHOD FOR A TIME-TO-DIGITAL CONVERTER

    • Publication number 20150268633
    • Publication date Sep 24, 2015
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Mao-Hsuan Chou
    • G04 - HOROLOGY
  • Information Patent Application

    Time-to-Digital Converter and Related Method

    • Publication number 20150248114
    • Publication date Sep 3, 2015
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Jinn-Yeh Chien
    • G04 - HOROLOGY
  • Information Patent Application

    In Situ on the Fly On-Chip Variation Measurement

    • Publication number 20150177327
    • Publication date Jun 25, 2015
    • Taiwan Semiconductor Manufacturing Co., LTD
    • Jinn-Yeh Chien
    • G01 - MEASURING TESTING
  • Information Patent Application

    Time-to-Digital Converter and Related Method

    • Publication number 20150054667
    • Publication date Feb 26, 2015
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Jinn-Yeh Chien
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    SMART EDGE DETECTOR

    • Publication number 20120280718
    • Publication date Nov 8, 2012
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Shu-Chun YANG
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Application

    POWER SUPPLY REGULATOR

    • Publication number 20120229198
    • Publication date Sep 13, 2012
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Chen-Ting Ko
    • G05 - CONTROLLING REGULATING
  • Information Patent Application

    OUTPUT DRIVER

    • Publication number 20120212866
    • Publication date Aug 23, 2012
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Chen-Ting KO
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    BUILT IN SELF TEST FOR TRANSCEIVER

    • Publication number 20120169361
    • Publication date Jul 5, 2012
    • Taiwan Semiconductor Manufacturing Co., LTD
    • Jinn-Yeh CHIEN
    • G01 - MEASURING TESTING
  • Information Patent Application

    Built-in Bit Error Rate Test Circuit

    • Publication number 20120066559
    • Publication date Mar 15, 2012
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Jinn-Yeh Chien
    • G11 - INFORMATION STORAGE
  • Information Patent Application

    SMART EDGE DETECTOR

    • Publication number 20110199121
    • Publication date Aug 18, 2011
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Shu-Chun YANG
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Application

    DIGITAL PHASE INTERPOLATION CONTROL FOR CLOCK AND DATA RECOVERY CIR...

    • Publication number 20100098203
    • Publication date Apr 22, 2010
    • Taiwan Semiconductor Manufacturing Co., Ltd.
    • Jinn-Yeh Chien
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Application

    ADAPTIVE ELASTIC BUFFER FOR COMMUNICATIONS

    • Publication number 20100054385
    • Publication date Mar 4, 2010
    • Jinn-Yeh Chien
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Application

    FAST LOCKING CLOCK AND DATA RECOVERY

    • Publication number 20090279655
    • Publication date Nov 12, 2009
    • Taiwan Semiconductor Manufacturing Co., Ltd.
    • Jinn-Yeh Chien
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Application

    On-chip test apparatus

    • Publication number 20050193296
    • Publication date Sep 1, 2005
    • Taiwan Semiconductor Manufacturing Co., Ltd.
    • Jinn-Yeh Chien
    • G01 - MEASURING TESTING
  • Information Patent Application

    Memory built-in self test circuit with full error mapping capability

    • Publication number 20050166111
    • Publication date Jul 28, 2005
    • Taiwan Semiconductor Manufacturing Co.
    • Jinn-Yeh Chien
    • G11 - INFORMATION STORAGE