Jinseob KIM

Person

Incheon, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Pupil ellipsometry measurement apparatus and method and method of f...
- Patent number 12,228,499
- Issue date Feb 18, 2025
- Samsung Electronics Co., Ltd.
- Jaehwang Jung
- G01 - MEASURING TESTING
Information Patent Grant
Metrology apparatus and method based on diffraction using oblique i...
- Patent number 12,002,698
- Issue date Jun 4, 2024
- Samsung Electronics Co., Ltd.
- Myungjun Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Hyperspectral imaging (HSI) apparatus and inspection apparatus incl...
- Patent number 11,898,912
- Issue date Feb 13, 2024
- Samsung Electronics Co., Ltd.
- Sungho Jang
- G01 - MEASURING TESTING
Information Patent Grant
Pupil ellipsometry measurement apparatus and method and method of f...
- Patent number 11,604,136
- Issue date Mar 14, 2023
- Samsung Electronics Co., Ltd.
- Jaehwang Jung
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
IMAGE MEASUREMENT DEVICE AND METHOD THEREOF
- Publication number 20250044222
- Publication date Feb 6, 2025
- Samsung Electronics Co., Ltd.
- Seungwoo LEE
- G01 - MEASURING TESTING
Information Patent Application
IMAGE MEASUREMENT DEVICE AND METHOD THEREOF
- Publication number 20250045870
- Publication date Feb 6, 2025
- Samsung Electronics Co., Ltd.
- Seungwoo LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20250012556
- Publication date Jan 9, 2025
- Samsung Electronics Co., Ltd.
- Younguk Jin
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20240288265
- Publication date Aug 29, 2024
- Samsung Electronics Co., Ltd.
- Jinyong Kim
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20240230314
- Publication date Jul 11, 2024
- Samsung Electronics Co., Ltd.
- Garam CHOI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20240133673
- Publication date Apr 25, 2024
- Samsung Electronics Co., Ltd.
- Garam CHOI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20230400404
- Publication date Dec 14, 2023
- Samsung Electronics Co., Ltd.
- Garam Choi
- G01 - MEASURING TESTING
Information Patent Application
PUPIL ELLIPSOMETRY MEASUREMENT APPARATUS AND METHOD AND METHOD OF F...
- Publication number 20230204493
- Publication date Jun 29, 2023
- Samsung Electronics Co., Ltd.
- Jaehwang JUNG
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20230186460
- Publication date Jun 15, 2023
- Samsung Electronics Co., Ltd.
- Myungjun LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HYPERSPECTRAL IMAGING (HSI) APPARATUS AND INSPECTION APPARATUS INCL...
- Publication number 20220170792
- Publication date Jun 2, 2022
- Samsung Electronics Co., Ltd.
- Sungho Jang
- G01 - MEASURING TESTING
Information Patent Application
PUPIL ELLIPSOMETRY MEASUREMENT APPARATUS AND METHOD AND METHOD OF F...
- Publication number 20220074848
- Publication date Mar 10, 2022
- Samsung Electronics Co., Ltd.
- Jaehwang JUNG
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY APPARATUS AND METHOD BASED ON DIFFRACTION USING OBLIQUE I...
- Publication number 20220005715
- Publication date Jan 6, 2022
- Samsung Electronics Co., Ltd.
- Myungjun LEE
- G06 - COMPUTING CALCULATING COUNTING

Jinseob KIM

Person

Patents Grantslast 30 patents

Pupil ellipsometry measurement apparatus and method and method of f...

Metrology apparatus and method based on diffraction using oblique i...

Hyperspectral imaging (HSI) apparatus and inspection apparatus incl...

Pupil ellipsometry measurement apparatus and method and method of f...

Patents Applicationslast 30 patents

IMAGE MEASUREMENT DEVICE AND METHOD THEREOF

IMAGE MEASUREMENT DEVICE AND METHOD THEREOF

SEMICONDUCTOR MEASUREMENT APPARATUS

SEMICONDUCTOR MEASUREMENT APPARATUS

SEMICONDUCTOR MEASUREMENT APPARATUS

SEMICONDUCTOR MEASUREMENT APPARATUS

SEMICONDUCTOR MEASUREMENT APPARATUS

PUPIL ELLIPSOMETRY MEASUREMENT APPARATUS AND METHOD AND METHOD OF F...

SEMICONDUCTOR MEASUREMENT APPARATUS

HYPERSPECTRAL IMAGING (HSI) APPARATUS AND INSPECTION APPARATUS INCL...

PUPIL ELLIPSOMETRY MEASUREMENT APPARATUS AND METHOD AND METHOD OF F...

METROLOGY APPARATUS AND METHOD BASED ON DIFFRACTION USING OBLIQUE I...