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Jinshan Huo
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Corona, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method of and apparatus for manufacturing at least one measuring cell
Patent number
11,543,379
Issue date
Jan 3, 2023
Endress+Hauser Conducta Inc.
Jinshan Huo
G01 - MEASURING TESTING
Information
Patent Grant
Characterization and failure analysis of a sensor using impedance f...
Patent number
11,543,382
Issue date
Jan 3, 2023
Endress+Hauser Conducta Inc.
Jinshan Huo
G01 - MEASURING TESTING
Information
Patent Grant
Method of manufacturing ion-selective membranes
Patent number
11,536,686
Issue date
Dec 27, 2022
Endress+Hauser Conducta Inc.
Jinshan Huo
G01 - MEASURING TESTING
Information
Patent Grant
Sensor with nonporous reference junction
Patent number
11,209,380
Issue date
Dec 28, 2021
Endress+Hauser Conducta Inc.
Jinshan Huo
G01 - MEASURING TESTING
Information
Patent Grant
Failure analysis of a measuring sensor with an integrated temperatu...
Patent number
10,648,944
Issue date
May 12, 2020
Endress+Hauser Conducta Inc.
Jinshan Huo
G01 - MEASURING TESTING
Information
Patent Grant
Characterization and failure analysis of a sensor using impedance f...
Patent number
10,598,630
Issue date
Mar 24, 2020
Endress+Hauser Conducta Inc.
Jinshan Huo
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD OF AND APPARATUS FOR MANUFACTURING AT LEAST ONE MEASURING CELL
Publication number
20210356422
Publication date
Nov 18, 2021
Endress+Hauser Conducta, Inc.
Jinshan Huo
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF MANUFACTURING ION-SELECTIVE MEMBRANES
Publication number
20210356421
Publication date
Nov 18, 2021
Endress+Hauser Conducta, Inc.
Jinshan Huo
G01 - MEASURING TESTING
Information
Patent Application
CHARACTERIZATION AND FAILURE ANALYSIS OF A SENSOR USING IMPEDANCE F...
Publication number
20200225188
Publication date
Jul 16, 2020
ENDRESS+HAUSER CONDUCTA INC.
Jinshan Huo
G01 - MEASURING TESTING
Information
Patent Application
SENSOR WITH NONPOROUS REFERENCE JUNCTION
Publication number
20200110052
Publication date
Apr 9, 2020
ENDRESS+HAUSER CONDUCTA INC.
Jinshan Huo
G01 - MEASURING TESTING
Information
Patent Application
FAILURE ANALYSIS OF A MEASURING SENSOR WITH AN INTEGRATED TEMPERATU...
Publication number
20190277802
Publication date
Sep 12, 2019
ENDRESS+HAUSER CONDUCTA INC.
Jinshan Huo
G01 - MEASURING TESTING
Information
Patent Application
CHARACTERIZATION AND FAILURE ANALYSIS OF A SENSOR USING IMPEDANCE F...
Publication number
20180095054
Publication date
Apr 5, 2018
ENDRESS+HAUSER CONDUCTA INC.
Jinshan Huo
G01 - MEASURING TESTING