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Patents Grants
last 30 patents
Information
Patent Grant
Detection system and method for acquiring resonance angle of surfac...
Patent number
8,836,931
Issue date
Sep 16, 2014
National Center for Nanoscience and Technology, China
Kun Wang
G01 - MEASURING TESTING
Information
Patent Grant
Measuring method for SPR and system thereof
Patent number
8,416,416
Issue date
Apr 9, 2013
National Center for Nanoscience and Technology
Zheng Zheng
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
DETECTION SYSTEM AND METHOD FOR ACQUIRING RESONANCE ANGLE OF SURFAC...
Publication number
20110285986
Publication date
Nov 24, 2011
BEIHANG UNIVERSITY
Kun Wang
G01 - MEASURING TESTING
Information
Patent Application
WAVE-GUIDE COUPLING SPR SENSOR CHIP AND SENSOR CHIP ARRAY THEREOF
Publication number
20110037981
Publication date
Feb 17, 2011
National Center for Nanoscience and Technology, China
Jinsong Zhu
G01 - MEASURING TESTING
Information
Patent Application
MEASURING METHOD FOR SPR AND SYSTEM THEREOF
Publication number
20100321697
Publication date
Dec 23, 2010
Zheng Zheng
G01 - MEASURING TESTING