Jinsun KIM

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Seoul, KR

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Patents Grantslast 30 patents

Information Patent Grant
Overlay correction method and semiconductor fabrication method incl...
- Patent number 11,456,222
- Issue date Sep 27, 2022
- Samsung Electronics Co., Ltd.
- Woo-Yong Jung
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
OVERLAY MEASUREMENT METHOD AND METHOD OF MANUFACTURING SEMICONDUCTO...
- Publication number 20240219845
- Publication date Jul 4, 2024
- Samsung Electronics Co., Ltd.
- SEUNGHAK PARK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MEASURING OVERLAY OFFSET AND METHOD OF MANUFACTURING SEMI...
- Publication number 20240136234
- Publication date Apr 25, 2024
- Samsung Electronics Co., Ltd.
- Mingyoo CHOI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OVERLAY MEASURING METHOD AND SYSTEM, AND METHOD OF MANUFACTURING A...
- Publication number 20240133683
- Publication date Apr 25, 2024
- Samsung Electronics Co., Ltd.
- Inho KWAK
- G01 - MEASURING TESTING
Information Patent Application
OVERLAY MEASURING METHOD AND SEMICONDUCTOR DEVICE FABRICATED USING...
- Publication number 20230411393
- Publication date Dec 21, 2023
- Samsung Electronics Co., Ltd.
- Moosong LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OVERLAY CORRECTION METHOD AND SEMICONDUCTOR FABRICATION METHOD INCL...
- Publication number 20210116803
- Publication date Apr 22, 2021
- Samsung Electronics Co., Ltd.
- Woo-Yong JUNG
- H01 - BASIC ELECTRIC ELEMENTS