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Jinwoo Ahn
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Yongin-si, KR
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last 30 patents
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Patent Grant
Inspection system including reference specimen and method of formin...
Patent number
11,921,270
Issue date
Mar 5, 2024
Samsung Electronics Co., Ltd.
Sungil Choi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
IMAGING ASSEMBLY AND SPECTRAL IMAGING ELLIPSOMETER INCLUDING THE SAME
Publication number
20230204422
Publication date
Jun 29, 2023
Samsung Electronics Co., Ltd.
Jinwoo Ahn
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF INSPECTING A WAFER AND APPARATUS FOR PERFORMING THE SAME
Publication number
20230104399
Publication date
Apr 6, 2023
Samsung Electronics Co., Ltd.
Juntaek Oh
G01 - MEASURING TESTING
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Patent Application
INSPECTION SYSTEM INCLUDING REFERENCE SPECIMEN AND METHOD OF FORMIN...
Publication number
20230008686
Publication date
Jan 12, 2023
Samsung Electronics Co., Ltd.
Sungil Choi
G01 - MEASURING TESTING