Jinwoo Ahn

Person

Yongin-si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Method of inspecting a wafer and apparatus for performing the same
- Patent number 12,111,270
- Issue date Oct 8, 2024
- Samsung Electronics Co., Ltd.
- Juntaek Oh
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system including reference specimen and method of formin...
- Patent number 11,921,270
- Issue date Mar 5, 2024
- Samsung Electronics Co., Ltd.
- Sungil Choi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD OF OPTICAL MEASUREMENT OF NUMERICAL APERTURE OF O...
- Publication number 20250060276
- Publication date Feb 20, 2025
- Samsung Electronics Co., Ltd.
- Yeeun Park
- G01 - MEASURING TESTING
Information Patent Application
IMAGE MEASUREMENT DEVICE AND METHOD THEREOF
- Publication number 20250044222
- Publication date Feb 6, 2025
- Samsung Electronics Co., Ltd.
- Seungwoo LEE
- G01 - MEASURING TESTING
Information Patent Application
PUPIL IMAGE MEASURING DEVICE AND METHOD
- Publication number 20240167806
- Publication date May 23, 2024
- Samsung Electronics Co., Ltd.
- Seungwoo LEE
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20240125709
- Publication date Apr 18, 2024
- Samsung Electronics Co., Ltd.
- Donggun Lee
- G01 - MEASURING TESTING
Information Patent Application
IMAGING ASSEMBLY AND SPECTRAL IMAGING ELLIPSOMETER INCLUDING THE SAME
- Publication number 20230204422
- Publication date Jun 29, 2023
- Samsung Electronics Co., Ltd.
- Jinwoo Ahn
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF INSPECTING A WAFER AND APPARATUS FOR PERFORMING THE SAME
- Publication number 20230104399
- Publication date Apr 6, 2023
- Samsung Electronics Co., Ltd.
- Juntaek Oh
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM INCLUDING REFERENCE SPECIMEN AND METHOD OF FORMIN...
- Publication number 20230008686
- Publication date Jan 12, 2023
- Samsung Electronics Co., Ltd.
- Sungil Choi
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Method of inspecting a wafer and apparatus for performing the same

Inspection system including reference specimen and method of formin...

Patents Applicationslast 30 patents

SYSTEM AND METHOD OF OPTICAL MEASUREMENT OF NUMERICAL APERTURE OF O...

IMAGE MEASUREMENT DEVICE AND METHOD THEREOF

PUPIL IMAGE MEASURING DEVICE AND METHOD

SEMICONDUCTOR MEASUREMENT APPARATUS

IMAGING ASSEMBLY AND SPECTRAL IMAGING ELLIPSOMETER INCLUDING THE SAME

METHOD OF INSPECTING A WAFER AND APPARATUS FOR PERFORMING THE SAME

INSPECTION SYSTEM INCLUDING REFERENCE SPECIMEN AND METHOD OF FORMIN...