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Jinyeong Moon
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Cambridge, MA, US
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last 30 patents
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Patent Grant
Non-intrusive monitoring
Patent number
9,945,692
Issue date
Apr 17, 2018
Massachusetts Institute of Technology
Steven B. Leeb
G01 - MEASURING TESTING
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last 30 patents
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NON-INTRUSIVE MONITORING
Publication number
20140320125
Publication date
Oct 30, 2014
Steven B. Leeb
G01 - MEASURING TESTING