Jinyeong Yun

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Yongin-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Electric field measuring apparatus and method of measuring electric...
- Patent number 12,105,132
- Issue date Oct 1, 2024
- Samsung Electronics Co., Ltd.
- Jinyeong Yun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma processing apparatus and plasma processing method
- Patent number 12,020,909
- Issue date Jun 25, 2024
- Samsung Electronics Co., Ltd.
- Jang-Yeob Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor test device and system and test method using the same
- Patent number 11,782,085
- Issue date Oct 10, 2023
- Samsung Electronics Co., Ltd.
- Meehyun Lim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma processing apparatus and plasma processing method
- Patent number 11,646,179
- Issue date May 9, 2023
- Samsung Electronics Co., Ltd.
- Jang-Yeob Lee
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR EQUIPMENT MONITORING APPARATUS, AND SEMICONDUCTOR EQU...
- Publication number 20240055243
- Publication date Feb 15, 2024
- Samsung Electronics Co., Ltd.
- Taekjin Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR TEST DEVICE AND SYSTEM AND TEST METHOD USING THE SAME
- Publication number 20230408574
- Publication date Dec 21, 2023
- Samsung Electronics Co., Ltd.
- Meehyun Lim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD
- Publication number 20230230815
- Publication date Jul 20, 2023
- Samsung Electronics Co., Ltd.
- Jang-Yeob Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRIC FIELD MEASURING APPARATUS AND METHOD OF MEASURING ELECTRIC...
- Publication number 20230194591
- Publication date Jun 22, 2023
- Samsung Electronics Co., Ltd.
- Jinyeong Yun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD
- Publication number 20220093369
- Publication date Mar 24, 2022
- Samsung Electronics Co., Ltd.
- Jang-Yeob Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR TEST DEVICE AND SYSTEM AND TEST METHOD USING THE SAME
- Publication number 20210156904
- Publication date May 27, 2021
- Samsung Electronics Co., Ltd.
- Meehyun Lim
- H01 - BASIC ELECTRIC ELEMENTS