Jirí Petrek

Follow

Person

Brno, CZ

People

Patents Grantslast 30 patents

Information Patent Grant
Method of examining a sample using a charged particle microscope
- Patent number 11,598,733
- Issue date Mar 7, 2023
- FEI Company
- Tomas Tûma
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE
- Publication number 20210033548
- Publication date Feb 4, 2021
- FEI Company
- Tomás Tuma
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE
- Publication number 20200393392
- Publication date Dec 17, 2020
- FEI Company
- Jan Klusácek
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE
- Publication number 20200355633
- Publication date Nov 12, 2020
- FEI Company
- Jan Klusácek
- G01 - MEASURING TESTING