Jiro Inoue

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Ryugasaki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Circuit pattern inspection apparatus
- Patent number 7,696,487
- Issue date Apr 13, 2010
- Hitachi High-Technologies Corporation
- Koichi Hayakawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Circuit pattern inspection apparatus
- Publication number 20070114397
- Publication date May 24, 2007
- Koichi Hayakawa
- G01 - MEASURING TESTING