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Jiro Tokita
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Sagamihara, JP
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Patents Grants
last 30 patents
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Patent Grant
Chemical monitoring method and apparatus, and incinerator
Patent number
6,723,286
Issue date
Apr 20, 2004
Hitachi, Ltd.
Minoru Sakairi
G01 - MEASURING TESTING
Information
Patent Grant
Defect observing electron microscope
Patent number
5,744,800
Issue date
Apr 28, 1998
Hitachi, Ltd.
Hiroshi Kakibayashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for detecting disorders in genomic substances
Patent number
5,194,372
Issue date
Mar 16, 1993
Hitachi, Ltd.
Keiichi Nagai
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Grant
Instrument for determination of the base sequence of nucleic acid
Patent number
4,904,366
Issue date
Feb 27, 1990
Hitachi, Ltd.
Jiro Tokita
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for determining base sequence of nucleic acid
Patent number
4,830,830
Issue date
May 16, 1989
Hitachi, Ltd.
Simada Tamotu
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Chemical monitoring method and apparatus, and incinerator
Publication number
20040169139
Publication date
Sep 2, 2004
Hitachi, Ltd.
Minoru Sakairi
G01 - MEASURING TESTING
Information
Patent Application
Chemical monitoring method and apparatus, and incinerator
Publication number
20020110490
Publication date
Aug 15, 2002
Hitachi, Ltd.
Minoru Sakairi
G01 - MEASURING TESTING
Information
Patent Application
Chemical monitoring method and apparatus, and incinerator
Publication number
20020048818
Publication date
Apr 25, 2002
Hitachi, Ltd.
Minoru Sakairi
G01 - MEASURING TESTING