Jiro UMEHARA

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Toyonaka-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Appearance inspection apparatus and appearance inspection method
- Patent number 10,803,572
- Issue date Oct 13, 2020
- JTEKT Corporation
- Jiro Umehara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Visual inspection device and visual inspection method
- Patent number 10,261,024
- Issue date Apr 16, 2019
- JTEKT Corporation
- Jiro Umehara
- G01 - MEASURING TESTING
Information Patent Grant
Appearance inspection apparatus and appearance inspection method
- Patent number 10,012,596
- Issue date Jul 3, 2018
- JTEKT Corporation
- Jiro Umehara
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Appearance Inspection Apparatus and Appearance Inspection Method
- Publication number 20180047152
- Publication date Feb 15, 2018
- JTEKT Corporation
- Jiro UMEHARA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPEARANCE INSPECTION APPARATUS AND APPEARANCE INSPECTION METHOD
- Publication number 20180045652
- Publication date Feb 15, 2018
- JTEKT Corporation
- Jiro UMEHARA
- G01 - MEASURING TESTING
Information Patent Application
Visual Inspection Device and Visual Inspection Method
- Publication number 20170328838
- Publication date Nov 16, 2017
- JTEKT Corporation
- Jiro UMEHARA
- G01 - MEASURING TESTING