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Jiro Yamamoto
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Nucleic acid analyzing device and nucleic acid analyzer
Patent number
8,865,403
Issue date
Oct 21, 2014
Hitachi High-Technologies Corporation
Masatoshi Narahara
G01 - MEASURING TESTING
Information
Patent Grant
Standard member for calibration and method of manufacturing the sam...
Patent number
8,735,816
Issue date
May 27, 2014
Hitachi High-Technologies Corporation
Yoshinori Nakayama
B32 - LAYERED PRODUCTS
Information
Patent Grant
Calibration standard member, method for manufacturing the member an...
Patent number
8,373,113
Issue date
Feb 12, 2013
Hitachi High-Technologies Corporation
Yoshinori Nakayama
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Length measurement system
Patent number
8,369,602
Issue date
Feb 5, 2013
Hitachi High-Technologies Corporation
Atsuko Yamaguchi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Semiconductor device
Patent number
7,816,702
Issue date
Oct 19, 2010
Hitachi, Ltd.
Shinichi Saito
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Semiconductor device and manufacturing method thereof
Patent number
6,964,832
Issue date
Nov 15, 2005
Hitachi, Ltd.
Akemi Moniwa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device and a manufacturing method of the same
Patent number
6,709,880
Issue date
Mar 23, 2004
Hitachi, Ltd.
Jiro Yamamoto
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
CULTURING SHEET, CULTURING EQUIPMENT MATERIAL AND MANUFACTURING METHOD
Publication number
20140162351
Publication date
Jun 12, 2014
Hitachi, Ltd
Jiro Yamamoto
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Application
Culture Substrate and Culture Sheet
Publication number
20130323839
Publication date
Dec 5, 2013
HITACHI, LTD.
Ryosuke Takahashi
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Application
STANDARD MEMBER FOR CALIBRATION AND METHOD OF MANUFACTURING THE SAM...
Publication number
20130299699
Publication date
Nov 14, 2013
Yoshinori Nakayama
B32 - LAYERED PRODUCTS
Information
Patent Application
CALIBRATION STANDARD MEMBER, METHOD FOR MANUFACTURING THE MEMBER AN...
Publication number
20110210250
Publication date
Sep 1, 2011
Hitachi High-Technologies Corporation
Yoshinori Nakayama
G01 - MEASURING TESTING
Information
Patent Application
NUCLEIC ACID ANALYZING DEVICE AND NUCLEIC ACID ANALYZER
Publication number
20110081655
Publication date
Apr 7, 2011
Masatoshi Narahara
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DEVICE
Publication number
20090090925
Publication date
Apr 9, 2009
Hitachi, Ltd.
Shinichi Saito
B82 - NANO-TECHNOLOGY
Information
Patent Application
LENGTH MEASUREMENT SYSTEM
Publication number
20090046896
Publication date
Feb 19, 2009
Atsuko YAMAGUCHI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Semiconductor device and manufacturing method thereof
Publication number
20030228758
Publication date
Dec 11, 2003
Akemi Moniwa
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Semiconductor device and a manufacturing method of the same
Publication number
20030054580
Publication date
Mar 20, 2003
Hitachi, Ltd.
Jiro Yamamoto
B82 - NANO-TECHNOLOGY