Jisu Ryu

Person

Hwaseong-Si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Electronic device and method for diagnosing battery thereof
- Patent number 11,994,562
- Issue date May 28, 2024
- Samsung Electronics Co., Ltd.
- Sengtai Lee
- G01 - MEASURING TESTING
Information Patent Grant
Simulation method for semiconductor fabrication process and method...
- Patent number 11,982,980
- Issue date May 14, 2024
- Samsung Electronics Co., Ltd.
- Jinwoo Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor wafer fault analysis system and operation method thereof
- Patent number 11,741,596
- Issue date Aug 29, 2023
- Samsung Electronics Co., Ltd.
- Min-Chul Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor fault analysis device and fault analysis method thereof
- Patent number 10,650,910
- Issue date May 12, 2020
- Samsung Electronics Co., Ltd.
- Changwook Jeong
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic memory devices including in-plane current layers
- Patent number 9,882,120
- Issue date Jan 30, 2018
- Samsung Electronics Co., Ltd.
- Sungmin Ahn
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
WEARABLE DEVICE, METHOD, AND NON-TRANSITORY COMPUTER READABLE STORA...
- Publication number 20250014301
- Publication date Jan 9, 2025
- Samsung Electronics Co., Ltd.
- Jisu RYU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMPUTING DEVICE AND METHOD GENERATING OPTIMAL INPUT DATA
- Publication number 20230169240
- Publication date Jun 1, 2023
- Samsung Electronics Co., Ltd.
- JINWOO KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRONIC DEVICE AND METHOD OF CONTROLLING WIRELESS CHARGING USING...
- Publication number 20230062165
- Publication date Mar 2, 2023
- Samsung Electronics Co., Ltd.
- Jisu RYU
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
ELECTRONIC DEVICE CAPABLE OF IDENTIFYING A STATE OF A RECHARGEABLE...
- Publication number 20220263326
- Publication date Aug 18, 2022
- Samsung Electronics Co., Ltd.
- Jisu RYU
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF PREDICTING SEMICONDUCTOR MATERIAL PROPERTIES AND METHOD O...
- Publication number 20220207393
- Publication date Jun 30, 2022
- Samsung Electronics Co., Ltd.
- Naoto Umezawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS OF GENERATING CIRCUIT MODELS AND MANUFACTURING INTEGRATED C...
- Publication number 20220121800
- Publication date Apr 21, 2022
- Samsung Electronics Co., Ltd.
- Yohan Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SIMULATION METHOD FOR SEMICONDUCTOR FABRICATION PROCESS AND METHOD...
- Publication number 20220043405
- Publication date Feb 10, 2022
- Samsung Electronics Co., Ltd.
- Jinwoo Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRONIC DEVICE AND METHOD FOR DIAGNOSING BATTERY THEREOF
- Publication number 20220026494
- Publication date Jan 27, 2022
- Samsung Electronics Co., LTD
- Sengtai LEE
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR WAFER FAULT ANALYSIS SYSTEM AND OPERATION METHOD THEREOF
- Publication number 20200175665
- Publication date Jun 4, 2020
- Samsung Electronics Co., Ltd.
- Min-Chul PARK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR FAULT ANALYSIS DEVICE AND FAULT ANALYSIS METHOD THEREOF
- Publication number 20190385695
- Publication date Dec 19, 2019
- Samsung Electronics Co., Ltd.
- Changwook JEONG
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC MEMORY DEVICES INCLUDING IN-PLANE CURRENT LAYERS AND METHO...
- Publication number 20160181512
- Publication date Jun 23, 2016
- Sungmin Ahn
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Electronic device and method for diagnosing battery thereof

Simulation method for semiconductor fabrication process and method...

Semiconductor wafer fault analysis system and operation method thereof

Semiconductor fault analysis device and fault analysis method thereof

Magnetic memory devices including in-plane current layers

Patents Applicationslast 30 patents

WEARABLE DEVICE, METHOD, AND NON-TRANSITORY COMPUTER READABLE STORA...

COMPUTING DEVICE AND METHOD GENERATING OPTIMAL INPUT DATA

ELECTRONIC DEVICE AND METHOD OF CONTROLLING WIRELESS CHARGING USING...

ELECTRONIC DEVICE CAPABLE OF IDENTIFYING A STATE OF A RECHARGEABLE...

METHOD OF PREDICTING SEMICONDUCTOR MATERIAL PROPERTIES AND METHOD O...

METHODS OF GENERATING CIRCUIT MODELS AND MANUFACTURING INTEGRATED C...

SIMULATION METHOD FOR SEMICONDUCTOR FABRICATION PROCESS AND METHOD...

ELECTRONIC DEVICE AND METHOD FOR DIAGNOSING BATTERY THEREOF

SEMICONDUCTOR WAFER FAULT ANALYSIS SYSTEM AND OPERATION METHOD THEREOF

SEMICONDUCTOR FAULT ANALYSIS DEVICE AND FAULT ANALYSIS METHOD THEREOF

MAGNETIC MEMORY DEVICES INCLUDING IN-PLANE CURRENT LAYERS AND METHO...